Reflectivity and diffraction study of Co Cu multilayer using synchrotron X-rays

Citation
Cc. Tang et al., Reflectivity and diffraction study of Co Cu multilayer using synchrotron X-rays, J MAGN MAGN, 199, 1999, pp. 653-655
Citations number
9
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
ISSN journal
0304-8853 → ACNP
Volume
199
Year of publication
1999
Pages
653 - 655
Database
ISI
SICI code
0304-8853(199906)199:<653:RADSOC>2.0.ZU;2-3
Abstract
Synchrotron powder diffraction measurements were obtained from a Co/Cu mult ilayer produced by low energy ion-assisted deposition. The experiment was c arried out on the high resolution diffractometer on Station 2.3 at the SRS, Daresbury Laboratory. Exploiting the parallel beam optics, high photon flu x and wavelength tunability of the instrument, the anomalous reflectivity m ethod was used to examine the multilayer structure. With its inherent instr umental advantages, shifts in powder peak position have been measured using the sin(2)psi diffraction technique, and the average in-plane stress prese nt in the sample has been determined. (C) 1999 Elsevier Science B.V. All ri ghts reserved.