Thin film diamond alpha detectors for dosimetry applications

Citation
P. Bergonzo et al., Thin film diamond alpha detectors for dosimetry applications, DIAM RELAT, 8(2-5), 1999, pp. 952-955
Citations number
16
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
DIAMOND AND RELATED MATERIALS
ISSN journal
0925-9635 → ACNP
Volume
8
Issue
2-5
Year of publication
1999
Pages
952 - 955
Database
ISI
SICI code
0925-9635(199903)8:2-5<952:TFDADF>2.0.ZU;2-Y
Abstract
Diamond is a resilient material with rather extreme electronic properties. As such it is an interesting candidate for the fabrication of high performa nce solid state particle detectors. However, the commercially accessible fo rm of diamond, grown by chemical vapour deposition (CVD) methods, is polycr ystalline in nature and often displays rather poor electrical characteristi cs. This paper considers the way that this material may be used to form alp ha particle dosimeters with useful performance levels. One approach adopted has been to reduce the impurity levels within the feed-stock gases that ar e used to grow the diamond films. This has enabled significant improvements to be achieved in the mean carrier drift distance within the films leading alpha detectors with up to 40% collection efficiencies. An alternative app roach explored is the use of planar device geometry whereby charge collecti on is limited to the top surface of the diamond which comprises higher qual ity material than the bulk of the film. This has lead to collection efficie ncies of greater than 70%, the highest yet reported for polycrystalline CVD material based detectors. Techniques for improving the characteristics of these devices further are discussed. (C) 1999 Elsevier Science S.A. All rig hts reserved.