2-WAVELENGTH INTERFEROMETRY THAT USES A FOURIER-TRANSFORM METHOD

Authors
Citation
R. Onodera et Y. Ishii, 2-WAVELENGTH INTERFEROMETRY THAT USES A FOURIER-TRANSFORM METHOD, Applied optics, 37(34), 1998, pp. 7988-7994
Citations number
26
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Optics
Journal title
ISSN journal
0003-6935
Volume
37
Issue
34
Year of publication
1998
Pages
7988 - 7994
Database
ISI
SICI code
0003-6935(1998)37:34<7988:2ITUAF>2.0.ZU;2-#
Abstract
Two-wavelength interferometry that is based on a Fourier-transform met hod has been investigated. A phase profile at a synthetic wavelength h as been measured from a two-wavelength interferogram with two spatial carrier frequencies. A phase error caused by the difference between mo dulation intensities at two wavelengths has been theoretically and num erically analyzed. A phase map without the error can be obtained from a power-spectrum adjustment in the two-wavelength interferogram. (C) 1 998 Optical Society of America.