ATOMIC-RESOLUTION X-RAY-FLUORESCENCE HOLOGRAPHY OF ZN (0.02 WT-PERCENT) IN A GAAS WAFER

Citation
K. Hayashi et al., ATOMIC-RESOLUTION X-RAY-FLUORESCENCE HOLOGRAPHY OF ZN (0.02 WT-PERCENT) IN A GAAS WAFER, Analytical sciences, 14(5), 1998, pp. 987-990
Citations number
13
Language
INGLESE
art.tipo
Letter
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
0910-6340
Volume
14
Issue
5
Year of publication
1998
Pages
987 - 990
Database
ISI
SICI code
0910-6340(1998)14:5<987:AXHOZ(>2.0.ZU;2-V