TXRF ANALYSIS OF SOLUTION SAMPLES USING POLYESTER FILM AS A DISPOSABLE SAMPLE-CARRIER COVER

Citation
H. Yamaguchi et al., TXRF ANALYSIS OF SOLUTION SAMPLES USING POLYESTER FILM AS A DISPOSABLE SAMPLE-CARRIER COVER, Analytical sciences, 14(5), 1998, pp. 909-912
Citations number
10
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Chemistry Analytical
Journal title
ISSN journal
0910-6340
Volume
14
Issue
5
Year of publication
1998
Pages
909 - 912
Database
ISI
SICI code
0910-6340(1998)14:5<909:TAOSSU>2.0.ZU;2-Z
Abstract
The performance of polyester film was examined as a disposable cover o f the sample-carrier (silicon wafer). The cover offers convenience and economy for the total reflection X-ray fluorescence (TXRF) analysis o f solution samples. Moreover, the measurement of Al K-alpha (1.487 keV ) and P K-alpha (2.013 keV) peaks is possible because of the reduction of Si K-alpha X-rays (1.740 keV) from the sample-carrier. Not only th e trace elements (Cr, Mn, Co, Ni and Cu) but also the low sensitivity elements (Al and P) in JSS iron and steel standard samples were succes sfully analyzed.