A METHOD FOR IN-SITU CHARACTERIZATION OF TIP SHAPE IN AC-MODE ATOMIC-FORCE MICROSCOPY USING ELECTROSTATIC INTERACTION

Citation
L. Olsson et al., A METHOD FOR IN-SITU CHARACTERIZATION OF TIP SHAPE IN AC-MODE ATOMIC-FORCE MICROSCOPY USING ELECTROSTATIC INTERACTION, Journal of applied physics, 84(8), 1998, pp. 4060-4064
Citations number
15
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
0021-8979
Volume
84
Issue
8
Year of publication
1998
Pages
4060 - 4064
Database
ISI
SICI code
0021-8979(1998)84:8<4060:AMFICO>2.0.ZU;2-7
Abstract
We present a method for situ characterization of the tip shape in atom ic force microscopes that can operate in noncontact ac mode. By sweepi ng the voltage between tip and sample while recording the sample posit ion as it is regulated to give a constant force gradient, we obtain cu rves giving information about the tip geometry. The measurements were performed in ultrahigh vacuum using electrochemically etched tungsten tips against a surface of doped silicon. Our results show that the sph ere model gives a good description of the interaction, and that the ra dii we obtain are consistent with data from scanning electron microsco py. The method can also be used to estimate the value of the Hamaker c onstant and the contact potential between tip and sample. (C) 1998 Ame rican Institute of Physics. [S0021-8979(98)03420-3].