DETERMINATION OF THE LINEAR ELECTROOPTIC COEFFICIENT OF A LEAD-ZIRCONATE-TITANATE THIN-FILM USING 2-BEAM POLARIZATION INTERFEROMETER WITH AN ADAPTIVE PHOTODETECTOR

Citation
Vv. Spirin et al., DETERMINATION OF THE LINEAR ELECTROOPTIC COEFFICIENT OF A LEAD-ZIRCONATE-TITANATE THIN-FILM USING 2-BEAM POLARIZATION INTERFEROMETER WITH AN ADAPTIVE PHOTODETECTOR, JPN J A P 2, 37(5A), 1998, pp. 519-521
Citations number
11
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Physics, Applied
Volume
37
Issue
5A
Year of publication
1998
Pages
519 - 521
Database
ISI
SICI code
0021-4922(1998)37:5A<519:DOTLEC>2.0.ZU;2-C
Abstract
A novel interferometric modulation technique for optical thin-film tes ting using a two-beam polarization (TBP) interferometer with GaAs:Cr a daptive photodetector is presented. The technique enables determinatio n of Pockels coefficient of thin films with a strong Fabry Perot effec t and automatic adjustment and maintenance operation point of the inte rferometer. We use this method for measuring the effective differentia l linear electrooptic coefficient r(e) = r(33) - (n(0)/n(e))(3)r(13) O f lead zirconate titanate (PZT) thin film. A strong hysteresis effect with a slightly asymmetric form of the hysteresis loop was observed fo r the dependence of the effective differential Pockels coefficient of the PZT thin film on the DC electric field. The values of r(e) are in agreement with known data.