MEASUREMENT OF THE POCKELS COEFFICIENT OF LEAD-ZIRCONATE-TITANATE THIN-FILMS BY A 2-BEAM POLARIZATION INTERFEROMETER WITH A REFLECTION CONFIGURATION

Citation
Vv. Spirin et al., MEASUREMENT OF THE POCKELS COEFFICIENT OF LEAD-ZIRCONATE-TITANATE THIN-FILMS BY A 2-BEAM POLARIZATION INTERFEROMETER WITH A REFLECTION CONFIGURATION, Journal of the Optical Society of America. B, Optical physics, 15(7), 1998, pp. 1940-1946
Citations number
17
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Optics
ISSN journal
0740-3224
Volume
15
Issue
7
Year of publication
1998
Pages
1940 - 1946
Database
ISI
SICI code
0740-3224(1998)15:7<1940:MOTPCO>2.0.ZU;2-1
Abstract
A two-beam polarization (TBP) interferometer with a reflection configu ration for measuring the linear electrooptic coefficient is described and investigated experimentally and theoretically. It is shown that a TBP interferometer can be used for measuring the Pockels coefficient o f a thin film with a strong Fabry-Perot effect. Relative errors of the simple proposed method for Pockels coefficient measurement are estima ted. The TBP interferometer technique is used to measure the effective differential linear electro-optic coefficient r(e) = r(33) - (n(0)/n( e))(3)r(13) of a lead zirconate titanate thin film. The results are in agreement with known data. (C) 1998 Optical Society of America.