NORMAL AND INVERTED MEYER-NELDEL RULE IN HOT-WIRE CVD DEPOSITED NANOCRYSTALLINE SILICON

Citation
R. Bruggemann et al., NORMAL AND INVERTED MEYER-NELDEL RULE IN HOT-WIRE CVD DEPOSITED NANOCRYSTALLINE SILICON, Physica status solidi. a, Applied research, 166(2), 1998, pp. 11-12
Citations number
10
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
0031-8965
Volume
166
Issue
2
Year of publication
1998
Pages
11 - 12
Database
ISI
SICI code
0031-8965(1998)166:2<11:NAIMRI>2.0.ZU;2-G