ANALYSIS OF PLANE-WAVE SCATTERING BY A CONDUCTING THIN-PLATE AND A CRITERION FOR RAY-TRACING METHOD

Citation
K. Uchida et al., ANALYSIS OF PLANE-WAVE SCATTERING BY A CONDUCTING THIN-PLATE AND A CRITERION FOR RAY-TRACING METHOD, IEICE transactions on electronics, E81C(4), 1998, pp. 618-621
Citations number
9
Language
INGLESE
art.tipo
Letter
Categorie Soggetti
Engineering, Eletrical & Electronic
ISSN journal
0916-8524
Volume
E81C
Issue
4
Year of publication
1998
Pages
618 - 621
Database
ISI
SICI code
0916-8524(1998)E81C:4<618:AOPSBA>2.0.ZU;2-8
Abstract
This paper presents almost rigorous Wiener-Hopf solutions to the plane wave scattering by a conducting finite thin plate. The final field ex pressions are given in an analytically compact form and the results ar e accurate as long as the plate width is greater than the wavelength. Numerical examples are given for the near and far field distributions. A criterion is also proposed to estimate under what condition the ray tracing method holds.