Flux-flow instability and its anisotropy in Bi2Sr2CaCu2O8+delta superconducting films

Citation
Zl. Xiao et al., Flux-flow instability and its anisotropy in Bi2Sr2CaCu2O8+delta superconducting films, PHYS REV B, 59(2), 1999, pp. 1481-1490
Citations number
44
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
0163-1829 → ACNP
Volume
59
Issue
2
Year of publication
1999
Pages
1481 - 1490
Database
ISI
SICI code
0163-1829(19990101)59:2<1481:FIAIAI>2.0.ZU;2-3
Abstract
We report measurements on voltage instability at high flux-flow velocities in Bi2Sr2CaCu2O8 + delta superconducting films. Current-voltage (I - V) cha racteristics have been measured as a function of temperature, magnetic fiel d, and angle between the field and the c axis of the sample. Voltage jumps were observed in I-V characteristics taken in all magnetic-held directions and in extended temperature and field ranges. An analysis of the experiment al data, based on a theory for viscous flux-flow instability with a finite heat-removal rate from the sample, yielded the inelastic scattering rate an d the diffusion length of quasiparticles. Reasonable values of the heat-tra nsfer coefficient from film to bath have been obtained. This theory can als o successfully explain the observed scaling behavior I*(T,H) = I*(H)(1 - T/ T-co)(3/2) with I*(H) proportional to 1/(1 + H/H-0)(alpha), where T-co, H-0 , and alpha are fitting parameters, determined by the temperature and magne tic-field dependence of the critical current I* at which the voltage jumps occur. A two-dimensional scaling for the angular dependence of the critical current I* and the critical voltage V* associated with the voltage jump ha s been found and interpreted with a model based on the two-dimensional beha vior of this system. [S0163-1829(99)10901-9].