Wavelet analysis of x-ray diffraction pattern for glass structures

Citation
Y. Ding et al., Wavelet analysis of x-ray diffraction pattern for glass structures, PHYS REV B, 58(21), 1998, pp. 14279-14287
Citations number
30
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B-CONDENSED MATTER
ISSN journal
0163-1829 → ACNP
Volume
58
Issue
21
Year of publication
1998
Pages
14279 - 14287
Database
ISI
SICI code
0163-1829(199812)58:21<14279:WAOXDP>2.0.ZU;2-R
Abstract
A wavelet analysis of x-ray diffraction patterns is introduced for analyzin g glass structures. The analysis indicates that within a short distance (si milar to 0.8 nm for silica glass) atoms in the glass are arranged around th e most probable positions which are almost as regular as the equilibrium po sitions in crystal. However, in glass the atomic distribution around the mo st probable position increases exponentially with increasing interatomic di stance (exponentially damped regularity), whereas the crystal does not have this kind of damping. Beyond this distance, it is difficult to determine t he structure in atomic scale due to the large atomic distribution. But, the analysis shows that the arrangement of quasiatomic planes in glass is stil l statistically regular (with damped regularity) up to an intermediate-dist ance, e.g., 2.5-3.0 nn for silica glass. Then glass structure might be quan titatively determined by means of the structure of corresponding crystals a nd of the extent of the distributions around the most probable positions fo r atoms, as well as of the sizes of the structurally correlated group. [S01 63-1829(98)04545-7].