The adhesion energy between polymer thin films and self-assembled monolayers

Citation
Av. Zhuk et al., The adhesion energy between polymer thin films and self-assembled monolayers, J MATER RES, 13(12), 1998, pp. 3555-3564
Citations number
22
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS RESEARCH
ISSN journal
0884-2914 → ACNP
Volume
13
Issue
12
Year of publication
1998
Pages
3555 - 3564
Database
ISI
SICI code
0884-2914(199812)13:12<3555:TAEBPT>2.0.ZU;2-Y
Abstract
A superlayer test has been adapted for the measurement of the fracture ener gy between epoxy thin films and self-assembled monolayers (SAM's) on Au/Ti/ Si substrates. The "arrest" mode of analysis has been shown to provide cons istent results, particularly when relatively wide lines are used to encoura ge lateral, decohesions. The fracture energy, Gamma(i), of the interface be tween the monolayer and the epoxy is varied by adjusting the ratio of COOH/ CH3 terminal groups. Connections among Gamma(i), the surface energies, and the inelastic deformations occurring in the epoxy are explored upon compari son with interface crack growth simulations.