SCANNING ELECTRON-MICROSCOPIC OBSERVATION DURING CRYSTALLIZATION OF NA-X AND RELATED ZEOLITES COMPARED WITH X-RAY-DIFFRACTION CRYSTALLINITY

Citation
N. Shigemoto et al., SCANNING ELECTRON-MICROSCOPIC OBSERVATION DURING CRYSTALLIZATION OF NA-X AND RELATED ZEOLITES COMPARED WITH X-RAY-DIFFRACTION CRYSTALLINITY, Journal of materials science letters, 13(9), 1994, pp. 660-662
Citations number
13
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Material Science
ISSN journal
0261-8028
Volume
13
Issue
9
Year of publication
1994
Pages
660 - 662
Database
ISI
SICI code
0261-8028(1994)13:9<660:SEODCO>2.0.ZU;2-3