A STUDY OF RESOLUTION LIMIT IN OPTICAL MICROSCOPY - NEAR AND FAR-FIELD

Authors
Citation
Mf. Xiao, A STUDY OF RESOLUTION LIMIT IN OPTICAL MICROSCOPY - NEAR AND FAR-FIELD, Optics communications, 132(5-6), 1996, pp. 403-409
Citations number
18
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Optics
Journal title
ISSN journal
0030-4018
Volume
132
Issue
5-6
Year of publication
1996
Pages
403 - 409
Database
ISI
SICI code
0030-4018(1996)132:5-6<403:ASORLI>2.0.ZU;2-G
Abstract
We present the separate homogeneous and evanescent field distribution for a single dipole and for 81 dipoles near a sample surface. We draw the division between the near and far field zone, or more precisely th e boundary of the zone where the evanescent field dominates. We demons trate that the resolution of the near field optical microscope is dete rmined by the field distribution in the whole system and the propertie s of the probe. We point out that the evanescent dot, thus the ultima resolution limit, can only be defined by the light wavelength and the object. We also discuss relevant aspects: evanescent diffraction, prob e influence and interference between the evanescent field and the prop agating waves.