PATENTS AS INDICATORS FOR THE EVALUATION OF INDUSTRIAL-RESEARCH OUTPUT

Authors
Citation
F. Narin, PATENTS AS INDICATORS FOR THE EVALUATION OF INDUSTRIAL-RESEARCH OUTPUT, Scientometrics, 34(3), 1995, pp. 489-496
Citations number
3
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Information Science & Library Science","Information Science & Library Science
Journal title
ISSN journal
0138-9130
Volume
34
Issue
3
Year of publication
1995
Pages
489 - 496
Database
ISI
SICI code
0138-9130(1995)34:3<489:PAIFTE>2.0.ZU;2-0
Abstract
Patent indicators are used in the evaluation of industrial research at many different levels of aggregation. They are used in policy-level a pplications to look at industrial research capability from a national or regional viewpoint comparing, for example, EU regional technology w ith that of Japan and North America. They are used in strategic-level applications to look at industrial research from a company viewpoint. For example, CHI Research, Inc. has used them to compare auto company research output company-by-company and technology-by-technology. They are used in tactical-level applications, typically involving technolog y tracing - where the performance of research groups is measured again st one another within the domain of a specific technology. At the tact ical level these indicators can characterize industrial research in th ree planes or stages: The early Precursor Plane, the current Technolog y Plane and the future-oriented Successor Plane. Finally, at the most precise level of evaluation, patent indicator techniques are now begin ning to be used in the United States in establishing the value of pate nt portfolios for cross-licensing purposes, and in patent infringement litigation, where citation techniques demonstrate the importance and utility of patented technology.