PHASE-EXTRACTION ANALYSIS OF LASER-DIODE PHASE-SHIFTING INTERFEROMETRY THAT IS INSENSITIVE TO CHANGES IN LASER POWER

Authors
Citation
R. Onodera et Y. Ishii, PHASE-EXTRACTION ANALYSIS OF LASER-DIODE PHASE-SHIFTING INTERFEROMETRY THAT IS INSENSITIVE TO CHANGES IN LASER POWER, Journal of the Optical Society of America. A, Optics, image science,and vision., 13(1), 1996, pp. 139-146
Citations number
17
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Optics
ISSN journal
1084-7529
Volume
13
Issue
1
Year of publication
1996
Pages
139 - 146
Database
ISI
SICI code
1084-7529(1996)13:1<139:PAOLPI>2.0.ZU;2-Y
Abstract
We investigate phase-shifting interferometry with a laser diode that i s insensitive to changes in laser power associated with variations in current. A phase-extraction algorithm is newly developed in which the tested phase from six interferograms is measured. A formulation of the algorithm is presented by a least-squares fitting of the interference fringes to the function of the interferogram that includes intensity variations produced by changes in laser power. The performance of the algorithm is compared with the technique of Fourier analysis. A phase error caused by the power change of the laser diode is analyzed theore tically by use of the conventional phase-measurement algorithm and the Fourier-analysis technique. The systematic error is numerically inves tigated in comparison with the experimental result. A good agreement b etween them is shown. (C) 1996 Optical Society of America