FOURIER DESCRIPTION OF THE PHASE-MEASURING PROCESS IN 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY

Authors
Citation
R. Onodera et Y. Ishii, FOURIER DESCRIPTION OF THE PHASE-MEASURING PROCESS IN 2-WAVELENGTH PHASE-SHIFTING INTERFEROMETRY, Optics communications, 137(1-3), 1997, pp. 27-30
Citations number
11
Language
INGLESE
art.tipo
Article
Categorie Soggetti
Optics
Journal title
ISSN journal
0030-4018
Volume
137
Issue
1-3
Year of publication
1997
Pages
27 - 30
Database
ISI
SICI code
0030-4018(1997)137:1-3<27:FDOTPP>2.0.ZU;2-V
Abstract
Two-wavelength phase-shifting interferometry with dual frequency-modul ated laser diodes has been investigated by using Fourier analysis. The phase shifts for each wavelength are produced by changing the wavelen gths of the laser diodes through variation of the injection currents. The counter-stepping phase shifts introduce equal fundamental frequenc ies with opposite signs into two-wavelength interferograms. A Fourier description indicates that the phase difference between two wavelength s can be directly determined from the four-stepping algorithm presente d in the interferogram domain. The frequency tunability in the laser d iode can easily make the fundamental frequencies set required for the two-wavelength interferometry.