Results: 1-25 | 26-50 | 51-59
Results: 1-25/59

Authors: Park, S Tenne, DA Salvan, G Kampen, TU Zahn, DRT
Citation: S. Park et al., Optical spectroscopy during growth of PTCDA-C-60 complex thin films, J PHYS CH B, 105(48), 2001, pp. 12076-12081

Authors: Paraian, AM Rossow, U Park, S Salvan, G Friedrich, M Kampen, TU Zahn, DRT
Citation: Am. Paraian et al., Optical anisotropy of organic layers on GaAs(001), J VAC SCI B, 19(4), 2001, pp. 1658-1661

Authors: Tenne, DA Haisler, VA Bakarov, AK Toropov, AI Gutakovsky, AK Shebanin, AP Zahn, DRT
Citation: Da. Tenne et al., Self-assembled islands in the (Ga,Al)As/InAs heteroepitaxial system studied by Raman spectroscopy, PHYS ST S-B, 224(1), 2001, pp. 25-29

Authors: Himcinschi, C Friedrich, M Murray, C Streiter, I Schulz, SE Gessner, T Zahn, DRT
Citation: C. Himcinschi et al., Characterization of silica xerogel films by variable-angle spectroscopic ellipsometry and infrared spectroscopy, SEMIC SCI T, 16(9), 2001, pp. 806-811

Authors: Thurzo, I Zahn, DRT Dua, AK
Citation: I. Thurzo et al., Charge deep-level transient spectroscopy of Al/intrinsic diamond/p(+)-Si Schottky diodes, SEMIC SCI T, 16(7), 2001, pp. 527-533

Authors: Salvan, G Tenne, DA Kampen, TU Scholz, R Jungnickel, G Frauenheim, T Zahn, DRT
Citation: G. Salvan et al., Raman spectroscopy: a powerful tool for characterisation of Ag/3,4,9,10-perylene-tetracarboxylic-dianhydride/GaAs heterostructures, APPL SURF S, 179(1-4), 2001, pp. 113-117

Authors: Kobitski, AY Salvan, G Wagner, HP Zahn, DRT
Citation: Ay. Kobitski et al., Time-resolved photoluminescence characterisation of thin PTCDA films on Si(100), APPL SURF S, 179(1-4), 2001, pp. 209-212

Authors: Park, S Kampen, TU Braun, W Zahn, DRT
Citation: S. Park et al., Photoemission study of Mg/PTCDA/Se-GaAs Schottky contacts, APPL SURF S, 175, 2001, pp. 249-254

Authors: Kampen, TU Salvan, G Tenne, D Scholz, R Zahn, DRT
Citation: Tu. Kampen et al., Growth of organic films on passivated semiconductor surfaces: gallium arsenide versus silicon, APPL SURF S, 175, 2001, pp. 326-331

Authors: Salvan, G Himcinschi, C Kobitski, AY Friedrich, M Wagner, HP Kampen, TU Zahn, DRT
Citation: G. Salvan et al., Crystallinity of PTCDA films on silicon derived via optical spectroscopic measurements, APPL SURF S, 175, 2001, pp. 363-368

Authors: Evans, DA Steiner, HJ Middleton, R Jones, TS Chen, CH Horn, K Park, S Kampen, TU Tenne, D Zahn, DRT Patchett, A McGovern, IT
Citation: Da. Evans et al., In-situ monitoring of the growth of copper phthalocyanine films on InSb byorganic molecular beam deposition, APPL SURF S, 175, 2001, pp. 374-378

Authors: Milekhin, A Stepina, NP Yakimov, AI Nikiforov, AI Schulze, S Zahn, DRT
Citation: A. Milekhin et al., Raman scattering study of Ge dot superlattices, APPL SURF S, 175, 2001, pp. 629-635

Authors: Himcinschi, C Milekhin, A Friedrich, M Hiller, K Wiemer, M Gessner, T Schulze, S Zahn, DRT
Citation: C. Himcinschi et al., Silicon oxide in Si-Si bonded wafers, APPL SURF S, 175, 2001, pp. 715-720

Authors: Kobitski, AY Zhuravlev, KS Wagner, HP Zahn, DRT
Citation: Ay. Kobitski et al., Self-trapped exciton recombination in silicon nanocrystals - art. no. 115423, PHYS REV B, 6311(11), 2001, pp. 5423

Authors: Zahn, DRT
Citation: Drt. Zahn, Raman studies of molecular thin films, PHYS ST S-A, 184(1), 2001, pp. 41-50

Authors: Esser, N Geurts, J Rossow, U Zahn, DRT
Citation: N. Esser et al., Papers dedicated to Professor Wolfgang Richter on the occasion of his 60thbirthday - Preface, PHYS ST S-A, 184(1), 2001, pp. VII-VIII

Authors: Himcinschi, C Milekhin, A Friedrich, M Hiller, K Wiemer, M Gessner, T Schulze, S Zahn, DRT
Citation: C. Himcinschi et al., Growth of buried silicon oxide in Si-Si bonded wafers upon annealing, J APPL PHYS, 89(3), 2001, pp. 1992-1994

Authors: Milekhin, AG Nikiforov, AI Pchelyakov, OP Schulze, S Zahn, DRT
Citation: Ag. Milekhin et al., Phonons in Ge/Si superlattices with Ge quantum dots, JETP LETTER, 73(9), 2001, pp. 461-464

Authors: Milekhin, A Stepina, NP Yakimov, AI Nikiforov, AI Schulze, S Zahn, DRT
Citation: A. Milekhin et al., Raman scattering of Ge dot superlattices, EUR PHY J B, 16(2), 2000, pp. 355-359

Authors: Kampen, TU Rossow, U Schumann, M Park, S Zahn, DRT
Citation: Tu. Kampen et al., Reflectance anisotropy spectroscopy of the growth of perylene-3,4,9,10-tetracarboxylic dianhydride on chalcogen passivated GaAs(001) surfaces, J VAC SCI B, 18(4), 2000, pp. 2077-2081

Authors: Milekhin, A Friedrich, M Hiller, K Wierner, M Gessner, T Zahn, DRT
Citation: A. Milekhin et al., Characterization of low-temperature wafer bonding by infrared spectroscopy, J VAC SCI B, 18(3), 2000, pp. 1392-1396

Authors: Scholz, R Kobitski, AY Kampen, TU Schreiber, M Zahn, DRT Jungnickel, G Frauenheim, T
Citation: R. Scholz et al., Resonant Raman spectroscopy of organic semiconductors, PHYS ST S-B, 221(1), 2000, pp. 541-544

Authors: Thurzo, I Beyer, R Zahn, DRT
Citation: I. Thurzo et al., Experimental evidence for complementary spatial sensitivities of capacitance and charge deep-level transient spectroscopies, SEMIC SCI T, 15(4), 2000, pp. 378-385

Authors: McGovern, IT Koebbel, A Leslie, A Dudzik, E Mitchell, CEJ McLean, AB Patchett, A Zahn, DRT Evans, DA Woodruff, DP Cowie, BCC
Citation: It. Mcgovern et al., X-ray standing wave study of wet-etch sulphur-treated InP(100) surfaces, APPL SURF S, 166(1-4), 2000, pp. 196-200

Authors: Park, S Querner, T Kampen, TU Braun, W Zahn, DRT
Citation: S. Park et al., The interface formation of PTCDA on Se-modified GaAs(100) surfaces, APPL SURF S, 166(1-4), 2000, pp. 376-379
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