Results: 1-9 |
Results: 9
Transport mechanisms in hydrogenated microcrystalline silicon
Authors: Brenot, R Vanderhaghen, R Drevillon, B Cabarrocas, PRI Rogel, R Mohammed-Brahim, T
Citation: R. Brenot et al., Transport mechanisms in hydrogenated microcrystalline silicon, THIN SOL FI, 383(1-2), 2001, pp. 53-56
Process monitoring of semiconductor thin films and interfaces by spectroellipsometry
Authors: Brenot, R Drevillon, B Bulkin, P Roca i Cabarrocas, P Vanderhaghen, R
Citation: R. Brenot et al., Process monitoring of semiconductor thin films and interfaces by spectroellipsometry, APPL SURF S, 154, 2000, pp. 283-290
In situ investigation of polymorphous silicon deposition
Authors: Morral, AFI Brenot, R Hamers, EAG Vanderhaghen, R Cabarrocas, PRI
Citation: Afi. Morral et al., In situ investigation of polymorphous silicon deposition, J NON-CRYST, 266, 2000, pp. 48-53
Measurement of transversal ambipolar diffusion coefficient in microcrystalline silicon
Authors: Brenot, R Vanderhaghen, R Drevillon, B Cabarrocas, PRI
Citation: R. Brenot et al., Measurement of transversal ambipolar diffusion coefficient in microcrystalline silicon, J NON-CRYST, 266, 2000, pp. 336-340
The origin of current gain under illumination in amorphous silicon n-i-p-i-n structures
Authors: Chatterjee, P Vanderhaghen, R Equer, B
Citation: P. Chatterjee et al., The origin of current gain under illumination in amorphous silicon n-i-p-i-n structures, J APPL PHYS, 87(4), 2000, pp. 1874-1881
Contactless electronic transport analysis of microcrystalline silicon
Authors: Brenot, R Vanderhaghen, R Drevillon, B Mohammed-Brahim, T Cabarrocas, PR
Citation: R. Brenot et al., Contactless electronic transport analysis of microcrystalline silicon, THIN SOL FI, 337(1-2), 1999, pp. 63-66
Stable microcrystalline silicon thin-film transistors produced by the layer-by-layer technique
Authors: Cabarrocas, PRI Brenot, R Bulkin, P Vanderhaghen, R Drevillon, B French, I
Citation: Pri. Cabarrocas et al., Stable microcrystalline silicon thin-film transistors produced by the layer-by-layer technique, J APPL PHYS, 86(12), 1999, pp. 7079-7082
Real-time measurement of the evolution of carrier mobility in thin-film semiconductors during growth
Authors: Brenot, R Vanderhaghen, R Drevillon, B Cabarrocas, PRI
Citation: R. Brenot et al., Real-time measurement of the evolution of carrier mobility in thin-film semiconductors during growth, APPL PHYS L, 74(1), 1999, pp. 58-60
Subpicosecond hot carrier cooling in amorphous silicon
Authors: White, JO Cuzeau, S Hulin, D Vanderhaghen, R
Citation: Jo. White et al., Subpicosecond hot carrier cooling in amorphous silicon, J APPL PHYS, 84(9), 1998, pp. 4984-4991
Risultati: 1-9 |