Results: 1-3 |
Results: 3

Authors: Shang, P Keyse, R Jones, IP Smallman, RE
Citation: P. Shang et al., Chemical analysis of grain boundaries using intense electron beams, PHIL MAG A, 79(10), 1999, pp. 2539-2552

Authors: Lee, CS Han, GW Smallman, RE Feng, D Lai, JKL
Citation: Cs. Lee et al., The influence of boron-doping on the effectiveness of grain boundary hardening in Ni3Al, ACT MATER, 47(6), 1999, pp. 1823-1830

Authors: Shang, P Jones, IP Smallman, RE
Citation: P. Shang et al., The formation and significance of stacking faults in boron doped Ni3Al deformed at 77 K, PHYS ST S-A, 174(2), 1999, pp. 343-352
Risultati: 1-3 |