Results: 1-10 |
Results: 10

Authors: Shang, P Petford-Long, AK Nickel, JH Sharma, M Anthony, TC
Citation: P. Shang et al., High-resolution electron microscopy study of tunnelling junctions with AlNand AlON barriers, J APPL PHYS, 89(11), 2001, pp. 6874-6876

Authors: Shang, P Hogwood, A Petford-Long, AK Anthony, TC
Citation: P. Shang et al., Lorentz microscopy study of magnetization reversal mechanism in magnetic tunnel junction elements, J APPL PHYS, 89(11), 2001, pp. 7368-7370

Authors: Pond, RC Shang, P Cheng, TT Aindow, M
Citation: Rc. Pond et al., Interfacial dislocation mechanism for diffusional phase transformations exhibiting martensitic crystallography: Formation of TiAl+Ti(3)Allamellae, ACT MATER, 48(5), 2000, pp. 1047-1053

Authors: Shang, P Cheng, TT Aindow, M
Citation: P. Shang et al., High-resolution electron microscopy of steps on misfitting lamellar gamma-alpha(2) interfaces in a Ti-44 at.% Al-8 at.% Nb alloy, PHIL MAG L, 80(1), 2000, pp. 1-10

Authors: Cho, CH Mel, QB Shang, P Lee, SS Lo, HL Guo, X Li, Y
Citation: Ch. Cho et al., Study of the gastrointestinal protective effects of polysaccharides from Angelica sinensis in rats, PLANTA MED, 66(4), 2000, pp. 348-351

Authors: Shang, P Keyse, R Jones, IP Smallman, RE
Citation: P. Shang et al., Chemical analysis of grain boundaries using intense electron beams, PHIL MAG A, 79(10), 1999, pp. 2539-2552

Authors: Shang, P Cheng, TT Aindow, M
Citation: P. Shang et al., A high-resolution electron microscopy study of steps on lamellar gamma-alpha(2) interfaces in a low-misfit TiAl-based alloy, PHIL MAG A, 79(10), 1999, pp. 2553-2575

Authors: Perez, JF Shang, P Morris, DG Jones, IP
Citation: Jf. Perez et al., The structure, thickness and chemistry of antiphase domain boundaries in heat-treated, rapidly solidified Ni3Al, PHIL MAG A, 79(1), 1999, pp. 179-192

Authors: Shang, P Yang, G Jones, IP Gough, CE Abell, JS Nadarzinski, K Kawazaki, M
Citation: P. Shang et al., Locating dysprosium dopant atoms in the Bi2Sr2CaCu2Oy unit cell: direct-space chemical crystallography, PHIL MAG L, 79(9), 1999, pp. 741-745

Authors: Shang, P Jones, IP Smallman, RE
Citation: P. Shang et al., The formation and significance of stacking faults in boron doped Ni3Al deformed at 77 K, PHYS ST S-A, 174(2), 1999, pp. 343-352
Risultati: 1-10 |