Results: 1-1 |
Results: 1

Authors: Brenot, R Drevillon, B Bulkin, P Roca i Cabarrocas, P Vanderhaghen, R
Citation: R. Brenot et al., Process monitoring of semiconductor thin films and interfaces by spectroellipsometry, APPL SURF S, 154, 2000, pp. 283-290
Risultati: 1-1 |