Results: 1-20 |
Results: 20

Authors: GOSTEV AV MATVIENKO AN RAU EI SAVIN VO SAVIN DO
Citation: Av. Gostev et al., INFORMATION DEPTH IN BSE-MODE IN SEM, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 591-598

Authors: GOSTEV AV ZHUKOV AN MOLL CH RAU EI YAKIMOV EB
Citation: Av. Gostev et al., INFORMATION ANALYZE OF ELECTRON-INDUCE EM F METHOD IN SEM, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 62(3), 1998, pp. 599-605

Authors: NIEDRIG H RAU EI
Citation: H. Niedrig et Ei. Rau, INFORMATION DEPTH AND SPATIAL-RESOLUTION IN BSE MICROTOMOGRAPHY IN SEM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 142(4), 1998, pp. 523-534

Authors: ARISTOV VV GVOSDOVER RS GOSTEV AV RAU EI SAVIN VO
Citation: Vv. Aristov et al., MODULATED MICROTOMOGRAPHY METHODS IN SEM - DEVELOPMENT AND NEW APPLICATIONS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 61(10), 1997, pp. 1959-1965

Authors: GOSTEV AV DREOMOVA NN RAU EI SAVIN VO SEDOV NN
Citation: Av. Gostev et al., IMPROVEMENT OF BACKSCATTERED ELECTRONS SP ECTROMETER IN THE SEM, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 61(10), 1997, pp. 1966-1971

Authors: BERGER D NIEDRIG H SCHLICHTING F RAU EI
Citation: D. Berger et al., MEASUREMENT OF ELECTRON-SPECTRA USING A POLAR TOROIDAL ELECTROSTATIC SPECTROMETER ADAPTED TO A STANDARD SEM, European journal of cell biology, 74, 1997, pp. 28-28

Authors: RAU EI NIEDRIG H
Citation: Ei. Rau et H. Niedrig, INFORMATION DEPTH AND SPATIAL-RESOLUTION IN BSE MICROTOMOGRAPHY IN SEM, European journal of cell biology, 74, 1997, pp. 28-28

Authors: RAU EI REIMER L
Citation: Ei. Rau et L. Reimer, ENERGY-SPECTRA OF BACKSCATTERED ELECTRONS FROM MULTILAYERED STRUCTURES ON A COMPACT SUBSTRATE, European journal of cell biology, 74, 1997, pp. 73-73

Authors: RAU EI YAKIMOV EB
Citation: Ei. Rau et Eb. Yakimov, E-BEAM TOMOGRAPHY OF PLANAR SEMICONDUCTOR STRUCTURES, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 52-56

Authors: SEDOV NN RAU EI SAVIN VO
Citation: Nn. Sedov et al., CALCULATIONS OF INFLUENCE OF MICROFIELDS ON DETECTING OF POTENTIAL CONTRAST IN SEM, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 60(2), 1996, pp. 65-71

Authors: DREOMOVA NN ZAITSEV SI KONONCKUK OV RAU EI USHAKOV NG CHUKALINA MV YAKIMOV EB
Citation: Nn. Dreomova et al., NEW PRINCIPLES OF SEMICONDUCTOR ANALYZER OF BACKSCATTERED ELECTRON-ENERGY, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 60(2), 1996, pp. 72-76

Authors: PAKHOMOVA IY RAU EI SAVIN VO SUVORINOV AV
Citation: Iy. Pakhomova et al., AXIS-SYMMETRICAL GRIDLESS COLLECTOR-ENERG Y ANALYZER OF SECONDARY ELECTRONS BASED ON THE ROBINSON DETECTOR, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 60(2), 1996, pp. 96-100

Authors: DREOMOVA NN RAU EI YAKIMOV EB
Citation: Nn. Dreomova et al., SOME ASPECTS OF SEM PROFILOMETRY IN THE B ACKSCATTERING ELECTRON MODE, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 60(2), 1996, pp. 101-104

Authors: RAU EI ROBINSON VNE
Citation: Ei. Rau et Vne. Robinson, AN ANNULAR TOROIDAL BACKSCATTERED ELECTRON-ENERGY ANALYZER FOR USE INSCANNING ELECTRON-MICROSCOPY, Scanning, 18(8), 1996, pp. 556-561

Authors: ARISTOV VV DREMOVA NN RAU EI
Citation: Vv. Aristov et al., CHARACTERISTICS AND EXAMPLES OF APPLICATI ONS OF TOROIDAL ENERGY ANALYZER IN RASTER ELECTRON-MICROSCOPY, Zurnal tehniceskoj fiziki, 66(10), 1996, pp. 172-181

Authors: RAU EI DREOMOVA NN MATVIENKO AN SAVIN VO SAVIN DO
Citation: Ei. Rau et al., IMAGE-CONTRAST AND SPECTROSCOPY OF MULTIL AYER MICROSTRUCTURES IN BACKSCATTERED ELECTRONS, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 59(2), 1995, pp. 87-94

Authors: ARISTOV VV RAU EI YAKIMOV EB
Citation: Vv. Aristov et al., APPARATUS ELECTRON-BEAM MICROTOMOGRAPHY IN SEM, Physica status solidi. a, Applied research, 150(1), 1995, pp. 211-219

Authors: DREMOVA NN RAU EI ROBINSON VNE
Citation: Nn. Dremova et al., ELECTRON-ENERGY ANALYZERS FOR SCANNING ELECTRON-MICROSCOPES, Instruments and experimental techniques, 38(1), 1995, pp. 95-99

Authors: ARISTOV VV ANDRIANOV MV RAU EI
Citation: Vv. Aristov et al., POSSIBILITIES AND FUTURE-TRENDS OF SCANNI NG SENSOR PROBE MULTISCAN, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 57(8), 1993, pp. 2-8

Authors: DRYOMOVA NN DROKIN AP ZAITZEV SI RAU EI YAKOMOV EB
Citation: Nn. Dryomova et al., CHARACTERIZATION OF MULTILAYER MICROSTRUC TURES AND SURFACE-RELIEF INBACKSCATTERING ELECTRON MODE OF SEM, Izvestia Akademii nauk SSSR. Seria fiziceskaa, 57(8), 1993, pp. 9-14
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