Results: 1-25 | 26-36
Results: 1-25/36

Authors: Goken, M Kempf, M Nix, WD
Citation: M. Goken et al., Hardness and modulus of the lamellar microstructure in PST-TiAl studied bynanoindentations and AFM, ACT MATER, 49(5), 2001, pp. 903-911

Authors: Qiu, X Huang, Y Nix, WD Hwang, KC Gao, H
Citation: X. Qiu et al., Effect of intrinsic lattice resistance in strain gradient plasticity, ACT MATER, 49(19), 2001, pp. 3949-3958

Authors: Huang, Y Aziz, MJ Hutchinson, JW Evans, AG Saha, R Nix, WD
Citation: Y. Huang et al., Comparison of mechanical properties of Ni3Al thin films in disordered FCC and ordered L1(2) phases, ACT MATER, 49(14), 2001, pp. 2853-2861

Authors: Wright, WJ Saha, R Nix, WD
Citation: Wj. Wright et al., Deformation mechanisms of the Zr40Ti14Ni10Cu12Be24 bulk metallic glass, MATER TRANS, 42(4), 2001, pp. 642-649

Authors: Uchic, MD Nix, WD
Citation: Md. Uchic et Wd. Nix, Sigmoidal creep of Ni-3(Al, Ta), INTERMETALL, 9(12), 2001, pp. 1053-1061

Authors: Uchic, MD Chrzan, DC Nix, WD
Citation: Md. Uchic et al., Primary creep of Ni-3(Al, Ta) in the anomalous flow regime, INTERMETALL, 9(10-11), 2001, pp. 963-969

Authors: Saha, R Xue, ZY Huang, Y Nix, WD
Citation: R. Saha et al., Indentation of a soft metal film on a hard substrate: strain gradient hardening effects, J MECH PHYS, 49(9), 2001, pp. 1997-2014

Authors: Kim, DK Nix, WD Vinci, RP Deal, MD Plummer, JD
Citation: Dk. Kim et al., Study of the effect of grain boundary migration on hillock formation in Althin films, J APPL PHYS, 90(2), 2001, pp. 781-788

Authors: Chrzan, DC Uchic, MD Nix, WD
Citation: Dc. Chrzan et al., Self-immobilization of superdislocations in Ll(2) alloys: a simple statistical analysis (vol 79, pg 2397, 1999), PHIL MAG A, 80(10), 2000, pp. 2467-2467

Authors: Brennan, S Munkholm, A Leung, OS Nix, WD
Citation: S. Brennan et al., X-ray measurements of the depth dependence of stress in gold films, PHYSICA B, 283(1-3), 2000, pp. 125-129

Authors: Kim, D Nix, WD Deal, MD Plummer, JD
Citation: D. Kim et al., Creep-controlled diffusional hillock formation in blanket aluminum thin films as a mechanism of stress relaxation, J MATER RES, 15(8), 2000, pp. 1709-1718

Authors: Huang, Y Xue, Z Gao, H Nix, WD Xia, ZC
Citation: Y. Huang et al., A study of microindentation hardness tests by mechanism-based strain gradient plasticity, J MATER RES, 15(8), 2000, pp. 1786-1796

Authors: Phillips, MA Ramaswamy, V Clemens, BM Nix, WD
Citation: Ma. Phillips et al., Stress and microstructure evolution during initial growth of Pt on amorphous substrates, J MATER RES, 15(11), 2000, pp. 2540-2546

Authors: Holloway, BC Kraft, O Shuh, DK Nix, WD Kelly, M Pianetta, P Hagstrom, S
Citation: Bc. Holloway et al., Role of delocalized nitrogen in determining the local atomic arrangement and mechanical properties of amorphous carbon nitride thin films, J VAC SCI A, 18(6), 2000, pp. 2964-2971

Authors: Berding, MA Nix, WD Rhiger, DR Sen, S Sher, A
Citation: Ma. Berding et al., Critical thickness in the HgCdTe/CdZnTe system, J ELEC MAT, 29(6), 2000, pp. 676-679

Authors: Kim, D Heiland, B Nix, WD Arzt, E Deal, MD Plummer, JD
Citation: D. Kim et al., Microstructure of thermal hillocks on blanket Al thin films, THIN SOL FI, 371(1-2), 2000, pp. 278-282

Authors: Huang, Y Gao, H Nix, WD Hutchinson, JW
Citation: Y. Huang et al., Mechanism-based strain gradient plasticity - II. Analysis, J MECH PHYS, 48(1), 2000, pp. 99-128

Authors: Leung, OS Munkholm, A Brennan, S Nix, WD
Citation: Os. Leung et al., A search for strain gradients in gold thin films on substrates using x-raydiffraction, J APPL PHYS, 88(3), 2000, pp. 1389-1396

Authors: Clemens, BM Nix, WD Ramaswamy, V
Citation: Bm. Clemens et al., Surface-energy-driven intermixing and its effect on the measurement of interface stress, J APPL PHYS, 87(6), 2000, pp. 2816-2820

Authors: Schulze, M Nix, WD
Citation: M. Schulze et Wd. Nix, Finite element analysis of the wedge delamination test, INT J SOL S, 37(7), 2000, pp. 1045-1063

Authors: Gao, H Ozkan, CS Nix, WD Zimmerman, JA Freund, LB
Citation: H. Gao et al., Atomistic models of dislocation formation at crystal surface ledges in Si1-xGex/Si(100) heteroepitaxial thin films, PHIL MAG A, 79(2), 1999, pp. 349-370

Authors: Chrzan, DC Uchic, MD Nix, WD
Citation: Dc. Chrzan et al., Self-immobilization of superdislocations in L1(2) alloys: a simple statistical analysis, PHIL MAG A, 79(10), 1999, pp. 2397-2412

Authors: Gao, H Zhang, L Nix, WD Thompson, CV Arzt, E
Citation: H. Gao et al., Crack-like grain-boundary diffusion wedges in thin metal films, ACT MATER, 47(10), 1999, pp. 2865-2878

Authors: Kitabjian, PH Garg, A Noebe, RD Nix, WD
Citation: Ph. Kitabjian et al., High-temperature deformation behavior of NiAl(Ti) solid-solution single crystals, MET MAT T A, 30(3), 1999, pp. 587-600

Authors: Ozkan, CS Nix, WD Gao, HJ
Citation: Cs. Ozkan et al., Stress-driven surface evolution in heteroepitaxial thin films: Anisotropy of the two-dimensional roughening mode, J MATER RES, 14(8), 1999, pp. 3247-3256
Risultati: 1-25 | 26-36