Results: 1-15 |
Results: 15

Authors: Boehme, C Kanschat, P Lips, K
Citation: C. Boehme et al., Quantum-beat recombination echoes, EUROPH LETT, 56(5), 2001, pp. 716-721

Authors: Waiblinger, M Lips, K Harneit, W Weidinger, A Dietel, E Hirsch, A
Citation: M. Waiblinger et al., Thermal stability of the endohedral fullerenes N@C-60, N@C-70, and P@C-60 (vol B 63, art. no. 045421, 2001) - art. no. 159901, PHYS REV B, 6415(15), 2001, pp. 9901

Authors: Waiblinger, M Lips, K Harneit, W Weidinger, A Dietel, E Hirsch, A
Citation: M. Waiblinger et al., Thermal stability of the endohedral fullerenes NaC60, NaC70, and PaC60 - art. no. 045421, PHYS REV B, 6304(4), 2001, pp. 5421

Authors: Jepsen, PU Schairer, W Libon, IH Lemmer, U Hecker, NE Birkholz, M Lips, K Schall, M
Citation: Pu. Jepsen et al., Ultrafast carrier trapping in microcrystalline silicon observed in opticalpump-terahertz probe measurements, APPL PHYS L, 79(9), 2001, pp. 1291-1293

Authors: Fuhs, W Kanschat, P Lips, K
Citation: W. Fuhs et al., Bandtails and defects in microcrystalline silicon (mu c-Si : H), J VAC SCI B, 18(3), 2000, pp. 1792-1795

Authors: Brehme, S Kanschat, P Lips, K Sieber, I Fuhs, W
Citation: S. Brehme et al., Electronic properties of highly P and B doped thin Si layers grown by ECR-CVD, MAT SCI E B, 69, 2000, pp. 232-237

Authors: Birkholz, M Kanschat, P Weiss, T Lips, K
Citation: M. Birkholz et al., Electron-paramagnetic resonance (EPR) and light-induced EPR investigationsof CuGaSe2, THIN SOL FI, 361, 2000, pp. 243-247

Authors: Lips, K Waiblinger, M Pietzak, B Weidinger, A
Citation: K. Lips et al., Atomic nitrogen encapsulated in fullerenes: Realization of a chemical Faraday cage, PHYS ST S-A, 177(1), 2000, pp. 81-91

Authors: Muller, R Kanschat, P von Aichberger, S Lips, K Fuhs, W
Citation: R. Muller et al., Identification of transport and recombination paths in homo and heterojunction silicon solar cells by electrically detected magnetic resonance, J NON-CRYST, 266, 2000, pp. 1124-1128

Authors: Kanschat, P Lips, K Fuhs, W
Citation: P. Kanschat et al., Identification of non-radiative recombination paths in microcrystalline silicon (mu c-Si : H), J NON-CRYST, 266, 2000, pp. 524-528

Authors: Birkholz, M Selle, B Conrad, E Lips, K Fuhs, W
Citation: M. Birkholz et al., Evolution of structure in thin microcrystalline silicon films grown by electron-cyclotron resonance chemical vapor deposition, J APPL PHYS, 88(7), 2000, pp. 4376-4379

Authors: Vanmoortel, I De Strycker, J Westbroek, P Temmerman, E Lips, K
Citation: I. Vanmoortel et al., Fast electrochemical method for estimation of the corrosion resistance of electrode materials in molten enamel, GLASS TECH, 41(5), 2000, pp. 156-160

Authors: Verhoef, S van Diemen-Steenvoorde, R Akkersdijk, WL Bax, NMA Ariyurek, Y Hermans, CJ van Nieuwenhuizen, O Nikkels, PGJ Lindhout, D Halley, DJJ Lips, K van den Ouweland, AMW
Citation: S. Verhoef et al., Malignant pancreatic tumour within the spectrum of tuberous sclerosis complex in childhood, EUR J PED, 158(4), 1999, pp. 284-287

Authors: Birkholz, M Kanschat, P Weiss, T Czerwensky, M Lips, K
Citation: M. Birkholz et al., Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe2, PHYS REV B, 59(19), 1999, pp. 12268-12271

Authors: Dietel, E Hirsch, A Pietzak, B Waiblinger, M Lips, K Weidinger, A Gruss, A Dinse, KP
Citation: E. Dietel et al., Atomic nitrogen encapsulated in fullerenes: Effects of cage variations, J AM CHEM S, 121(11), 1999, pp. 2432-2437
Risultati: 1-15 |