Results: 1-1 |
Results: 1

Authors: Byun, D Jhin, J Cho, S Kim, J Lee, SJ Hong, CH Kim, G Choi, WK
Citation: D. Byun et al., Reduction of defects in GaN on reactive ion beam treated sapphire by annealing, PHYS ST S-B, 228(1), 2001, pp. 315-318
Risultati: 1-1 |