Results: 1-16 |
Results: 16

Authors: Pastuovic, Z Jaksic, M James, RB Chattopadhyay, K Ma, X Burger, A
Citation: Z. Pastuovic et al., Influence of electrical contacts on charge collection profiles in CdZnTe studied by IBIC, NUCL INST A, 458(1-2), 2001, pp. 254-261

Authors: Fazinic, S Jaksic, M Campbell, JL Van Espen, P Blaauw, M Orlic, I
Citation: S. Fazinic et al., The 2000 IAEA test spectra for PIXE spectrometry, NUCL INST B, 183(3-4), 2001, pp. 439-448

Authors: Jaksic, M Borjanovic, V Pastuovic, Z Radovic, IB Skukan, N Pivac, B
Citation: M. Jaksic et al., IBICC characterisation of defect structures in polycrystalline silicon, NUCL INST B, 181, 2001, pp. 298-304

Authors: Pastuovic, Z Jaksic, M
Citation: Z. Pastuovic et M. Jaksic, Frontal IBICC study of the induced proton radiation damage in CdTe detectors, NUCL INST B, 181, 2001, pp. 344-348

Authors: Tadic, T Jaksic, M Medunic, Z Quartarone, E Mustarelli, P
Citation: T. Tadic et al., Microbeam studies of gel-polymer interfaces with Li anode and spinel cathode for Li ion battery applications using PIGE and PIXE spectroscopy, NUCL INST B, 181, 2001, pp. 404-407

Authors: Gracin, D Bogdanovic, I Borjanovic, V Jaksic, M Pastuovic, Z Dutta, JM Vlahovic, B Nemanich, RJ
Citation: D. Gracin et al., Quantitative analysis of a-Si1-xCx : H thin films by vibrational spectroscopy and nuclear methods, VACUUM, 61(2-4), 2001, pp. 303-308

Authors: Lu, R Manfredotti, C Fizzotti, F Vittone, E Jaksic, M
Citation: R. Lu et al., Study of proton irradiation induced CVD diamond priming by lateral micro-ion beam induced charge technique, MATER RES B, 36(1-2), 2001, pp. 47-55

Authors: Tadic, T Jaksic, M Capiglia, C Saito, Y Mustarelli, P
Citation: T. Tadic et al., External microbeam PIGE study of Li and F distribution in PVdF/HFP electrolyte gel polymer for lithium battery application, NUCL INST B, 161, 2000, pp. 614-618

Authors: Manfredotti, C Fizzotti, F LoGiudice, A Polesello, P Vittone, E Lu, R Jaksic, M
Citation: C. Manfredotti et al., Ion microbeam analysis of CVD diamond, DIAM RELAT, 8(8-9), 1999, pp. 1597-1601

Authors: Gracin, D Jaksic, M Yang, C Borjanovic, V Pracek, B
Citation: D. Gracin et al., Quantitative analysis of a-Si1-xCx : H thin films, APPL SURF S, 145, 1999, pp. 188-191

Authors: Polesello, P Manfredotti, C Fizzotti, F Lu, R Vittone, E Lerondel, G Rossi, AM Amato, G Boarino, L Galassini, S Jaksic, M Pastuovic, Z
Citation: P. Polesello et al., Micromachining of silicon with a proton microbeam, NUCL INST B, 158(1-4), 1999, pp. 173-178

Authors: Tadic, T Mokuno, Y Horino, Y Jaksic, M Desnica, ID Trojko, R
Citation: T. Tadic et al., High-energy resolution PIXE study of heat induced changes in cadmium compounds using ion microbeam, NUCL INST B, 158(1-4), 1999, pp. 241-244

Authors: Jaksic, M Pastuovic, Z Tadic, T
Citation: M. Jaksic et al., New developments in IBIC for the study of charge transport properties of radiation detector materials, NUCL INST B, 158(1-4), 1999, pp. 458-463

Authors: Vittone, E Fizzotti, F Gargioni, E Lu, R Polesello, P LoGiudice, A Manfredotti, C Galassini, S Jaksic, M
Citation: E. Vittone et al., Evaluation of the diffusion length in silicon diodes by means of the lateral IBIC technique, NUCL INST B, 158(1-4), 1999, pp. 476-480

Authors: Bogdanovic, I Tadic, T Jaksic, M Halabuka, Z Trautmann, D
Citation: I. Bogdanovic et al., L-shell ionization of Cd, Sb, Te, Ba, La, Eu, Tb and Yb by O-16 ions in the energy range from 0.19 to 0.75 MeV u(-1), NUCL INST B, 150(1-4), 1999, pp. 18-26

Authors: Jaksic, M Tadic, T Orlic, I Osipowicz, T Vittone, E Manfredotti, C
Citation: M. Jaksic et al., Imaging of charge collection properties of CVD diamond using high-resolution ion beam induced charge technique with protons and alpha particles, DIAM FILM T, 8(5), 1998, pp. 391-398
Risultati: 1-16 |