Results: 1-16 |
Results: 16

Authors: Misiuk, A Barcz, A Ratajczak, J Katcki, J Bak-Misiuk, J Bryja, L Surma, B Gawlik, G
Citation: A. Misiuk et al., Structure of oxygen - Implanted silicon single crystals treated at >= 1400K under high argon pressure, CRYST RES T, 36(8-10), 2001, pp. 933-941

Authors: Surma, B Bryja, L Misiuk, A Gawlik, G Jun, J Antonova, IV Prujszczyk, M
Citation: B. Surma et al., Infrared and photoluminescence studies on silicon oxide formation in oxygen-implanted silicon annealed under enhanced pressure, CRYST RES T, 36(8-10), 2001, pp. 943-952

Authors: Jagielski, J Piatkowska, A Matz, W Richter, E Gawlik, G Turos, A
Citation: J. Jagielski et al., Structural and micromechanical properties of ion-beam mixed tungsten-on-steel system, VACUUM, 63(4), 2001, pp. 671-677

Authors: Gawlik, G Ratajczak, R Turos, A Jagielski, J Bedell, S Lanford, WL
Citation: G. Gawlik et al., Hydrogen-ion implantation in GaAs, VACUUM, 63(4), 2001, pp. 697-700

Authors: Jaroszewicz, B Slysz, W Wegrzecki, M Domanski, K Grodecki, R Gawlik, G Kudla, A Wrzesinska, H Gorska, M Grabiec, P
Citation: B. Jaroszewicz et al., Investigation of ion implantation for fabrication of p-n junctions with modified silicon surface for photovoltaic devices, VACUUM, 63(4), 2001, pp. 721-724

Authors: Wierzchowski, W Wieteska, K Turos, A Graeff, W Gawlik, G
Citation: W. Wierzchowski et al., Synchrotron investigation of strain profiles in the implanted semiconductors, VACUUM, 63(4), 2001, pp. 767-773

Authors: Turos, A Gawlik, G Jagielski, J Stonert, A Madi, N Matz, W Mucklich, A
Citation: A. Turos et al., Atomic transport effects in Kr-ion bombarded ZrO2/Fe ternary system, NUCL INST B, 166, 2000, pp. 128-132

Authors: Jagielski, J Piatkowska, A Rymuza, Z Kusznierewicz, Z Treheux, D Boutard, D Thome, L Gawlik, G
Citation: J. Jagielski et al., Micromechanical measurements of ion-beam treated steel, WEAR, 238(1), 2000, pp. 48-55

Authors: Baszkiewicz, J Kamiinski, M Kozubowski, J Krupa, D Gosiewska, K Barcz, A Gawlik, G Jagielski, J
Citation: J. Baszkiewicz et al., Implantation of silicon ions into a surface layer of the Ti6A14V titanium alloy and its effect upon the corrosion resistance and structure of this layer, J MATER SCI, 35(3), 2000, pp. 767-775

Authors: Wierzchowski, W Wieteska, K Graeff, W Gawlik, G Pawlowska, M
Citation: W. Wierzchowski et al., White beam synchrotron topographic characterisation of silicon wafers directly bonded by oxide layer, ACT PHY P A, 96(2), 1999, pp. 283-288

Authors: Krupa, D Jezierska, E Baszkiewicz, J Wierzchon, T Barcz, A Gawlik, G Jagielski, J Sobczak, JW Bilinski, A Larisch, B
Citation: D. Krupa et al., Effect of carbon ion implantation on the structure and corrosion resistance of OT-4-0 titanium alloy, SURF COAT, 114(2-3), 1999, pp. 250-259

Authors: Piatkowska, A Gawlik, G Jagielski, J
Citation: A. Piatkowska et al., AFM studies of hydrogen implanted silicon, APPL SURF S, 141(3-4), 1999, pp. 333-338

Authors: Uglov, VV Fedotova, JA Jagielski, J Gawlik, G Stanek, J
Citation: Vv. Uglov et al., Transformation of amorphous a-(Fe-B) phase during nitrogen implantation, NUCL INST B, 159(4), 1999, pp. 218-226

Authors: Turos, A Gawlik, G Jagielski, J Stonert, A Matz, W Groetzschel, R
Citation: A. Turos et al., Ion beam mixing of the ZrO2/Fe system, NUCL INST B, 148(1-4), 1999, pp. 778-782

Authors: Jagielski, J Gawlik, G Turos, A Piatkowska, A Treheux, D Starczewski, L Szudrowicz, M
Citation: J. Jagielski et al., Study of micromechanical properties of ion-beam mixed layers, NUCL INST B, 148(1-4), 1999, pp. 941-945

Authors: Baszkiewicz, J Kozubowski, JA Krupa, D Kaminski, M Barcz, A Gawlik, G Jagielski, J
Citation: J. Baszkiewicz et al., Effect of silicon-ion implantation upon the corrosion properties of austenitic stainless steels, J MATER SCI, 33(18), 1998, pp. 4561-4568
Risultati: 1-16 |