Results: 1-8 |
Results: 8

Authors: Birkholz, M Conrad, E Fuhs, W
Citation: M. Birkholz et al., Crystallinity of thin silicon films deposited at low temperatures: Combined effect of biasing and structuring the substrate, JPN J A P 1, 40(6A), 2001, pp. 4176-4180

Authors: Birkholz, M Selle, B Fuhs, W Christiansen, S Strunk, HP Reich, R
Citation: M. Birkholz et al., Amorphous-crystalline phase transition during the growth of thin films: The case of microcrystalline silicon - art. no. 085402, PHYS REV B, 6408(8), 2001, pp. 5402

Authors: Jepsen, PU Schairer, W Libon, IH Lemmer, U Hecker, NE Birkholz, M Lips, K Schall, M
Citation: Pu. Jepsen et al., Ultrafast carrier trapping in microcrystalline silicon observed in opticalpump-terahertz probe measurements, APPL PHYS L, 79(9), 2001, pp. 1291-1293

Authors: Birkholz, M Kanschat, P Weiss, T Lips, K
Citation: M. Birkholz et al., Electron-paramagnetic resonance (EPR) and light-induced EPR investigationsof CuGaSe2, THIN SOL FI, 361, 2000, pp. 243-247

Authors: Birkholz, M Selle, B Conrad, E Lips, K Fuhs, W
Citation: M. Birkholz et al., Evolution of structure in thin microcrystalline silicon films grown by electron-cyclotron resonance chemical vapor deposition, J APPL PHYS, 88(7), 2000, pp. 4376-4379

Authors: Birkholz, M Kanschat, P Weiss, T Czerwensky, M Lips, K
Citation: M. Birkholz et al., Low-temperature electron-paramagnetic-resonance study of extrinsic and intrinsic defects in CuGaSe2, PHYS REV B, 59(19), 1999, pp. 12268-12271

Authors: Weiss, T Birkholz, M Saad, M Bleyhl, S Kunst, M Jager-Waldau, A Lux-Steiner, MC
Citation: T. Weiss et al., Ag-doped CuGaSe2 as a precursor for thin film solar cells, J CRYST GR, 199, 1999, pp. 1190-1195

Authors: Birkholz, M Bohne, W Rohrich, J Jager-Waldau, A Lux-Steiner, MC
Citation: M. Birkholz et al., Stoichiometry and impurity concentrations in II-VI compounds measured by elastic recoil detection analysis (ERDA), J CRYST GR, 197(3), 1999, pp. 571-575
Risultati: 1-8 |