Results: 1-25 | 26-49
Results: 1-25/49

Authors: BREESE MBH SMULDERS PJM
Citation: Mbh. Breese et Pjm. Smulders, PHASE-SPACE ANALYSIS OF PLANAR CHANNELED MEV PROTONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 145(3), 1998, pp. 346-353

Authors: BREESE MBH BAILES AA
Citation: Mbh. Breese et Aa. Bailes, DEFECT IMAGING USING CONVERGENT-BEAM ION CHANNELING PATTERNS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 140(1-2), 1998, pp. 178-184

Authors: DEKERCKHOVE DG BREESE MBH GRIME GW
Citation: Dg. Dekerckhove et al., AN OPTIMIZED BEAM ROCKING SYSTEM TO PRODUCE ANGLE-RESOLVED INFORMATION FROM SMALL AREAS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 140(1-2), 1998, pp. 199-208

Authors: BREESE MBH KING PJC DEKERCKHOVE DG
Citation: Mbh. Breese et al., STRAIN AND DEFECT IMAGING IN THIN-CRYSTALS USING A NUCLEAR MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 23-34

Authors: DEKERCKHOVE DG BREESE MBH MARSH MA GRIME GW
Citation: Dg. Dekerckhove et al., MASKLESS FABRICATION OF 3-DIMENSIONAL MICROSTRUCTURES IN PMMA USING ANUCLEAR MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 379-384

Authors: DEKERCKHOVE DG BREESE MBH WILKINSON AJ GRIME GW
Citation: Dg. Dekerckhove et al., DETECTION OF SMALL LATTICE STRAINS USING BEAM ROCKING ON A NUCLEAR MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1240-1243

Authors: BREESE MBH HORN KM
Citation: Mbh. Breese et Km. Horn, THE INFLUENCE OF ION-INDUCED DAMAGE ON LATERAL CHARGE COLLECTION AND IBIC IMAGE-CONTRAST, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1349-1354

Authors: BREESE MBH AMAKU A WILSHAW PR
Citation: Mbh. Breese et al., A COMPARISON BETWEEN THE USE OF EBIC AND IBIC MICROSCOPY FOR SEMICONDUCTOR DEFECT ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1355-1360

Authors: BREESE MBH DEKERCKHOVE DG
Citation: Mbh. Breese et Dg. Dekerckhove, TRANSMISSION ION MICROSCOPY USING A QUADRUPOLE TRIPLET AS AN OBJECTIVE LENS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 134(3-4), 1998, pp. 431-434

Authors: BREESE MBH
Citation: Mbh. Breese, BEAM BENDING USING GRADED COMPOSITION STRAINED LAYERS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 132(3), 1997, pp. 540-547

Authors: BREESE MBH DEKERCKHOVE DG KING PJC SMULDERS PJM
Citation: Mbh. Breese et al., DIRECT OBSERVATION OF LATTICE STRAIN IN SI1-XGEX SI CRYSTALS USING PLANAR CHANNELING PATTERNS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 132(1), 1997, pp. 177-187

Authors: ANDEWEG AH BALLESTRERO S BEER JUM BUTLER JE BREESE MBH CONNELL SH DINI L DOYLE BP DRUMMOND ML FORMENTI P HART RJ MACHI IZ MACLEAR RD MCQUEEN ID SCHAAFF P SIDERASHADDAD E SELLSCHOP JPF WERNICK G
Citation: Ah. Andeweg et al., THE SCHONLAND MICRO-SCANNING ION-BEAM ANALYSIS FACILITY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 37-44

Authors: FORMENTI P BREESE MBH CONNELL SH DOYLE BP DRUMMOND ML MACHI IZ MACLEAR RD SCHAAFF P SELLSCHOP JPF BENCH G SIDERASHADDAD E ANTOLAK A MORSE D
Citation: P. Formenti et al., HEAVY-ION AND PROTON-BEAMS IN HIGH-RESOLUTION IMAGING OF A FUNGI SPORE SPECIMEN USING STIM TOMOGRAPHY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 230-236

Authors: HORN KM DODD PE BREESE MBH DOYLE BL
Citation: Km. Horn et al., VERIFICATION OF 3-DIMENSIONAL CHARGE-TRANSPORT SIMULATIONS USING ION MICROBEAMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 470-477

Authors: SCHONE H BREESE MBH LEE SR BRIGGS RD CASALNUOVO SA DOYLE BL DRUMMOND TJ FRITZ IJ HAFICH MJ VAWTER GA
Citation: H. Schone et al., DISLOCATION IMAGING OF AN INALGAAS OPTOELECTRONIC MODULATOR USING IBICC, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 551-556

Authors: BREESE MBH SMULDERS PJM
Citation: Mbh. Breese et Pjm. Smulders, A STUDY OF CHANNELING PATTERNS FROM STRAINED SI1-XGEX SI BILAYERS CLOSE TO (011)AXES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 129(4), 1997, pp. 511-518

Authors: DEKERCKHOVE DG BREESE MBH GRIME GW
Citation: Dg. Dekerckhove et al., A BEAM ROCKING SYSTEM FOR THE OXFORD NUCLEAR MICROPROBE - A NEW APPROACH TO CHANNELING ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 129(4), 1997, pp. 534-542

Authors: BREESE MBH
Citation: Mbh. Breese, A REVIEW OF ION-BEAM-INDUCED CHARGE MICROSCOPY FOR INTEGRATED-CIRCUITANALYSIS, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 67-76

Authors: KING PJC BREESE MBH SMULDERS PJM WILSHAW PR GRIME GW
Citation: Pjc. King et al., DEFECT IMAGING AND CHANNELING STUDIES USING CHANNELING SCANNING-TRANSMISSION ION MICROSCOPY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 426-430

Authors: BREESE MBH
Citation: Mbh. Breese, MULTIPLE-BEAM ION CHANNELING PATTERNS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 114(3-4), 1996, pp. 252-258

Authors: BREESE MBH KING PJC SMULDERS PJM
Citation: Mbh. Breese et al., CHARACTERIZATION OF STRAIN IN CRYSTAL BILAYERS USING ION-CHANNELING PATTERNS, Physical review. B, Condensed matter, 54(14), 1996, pp. 9693-9702

Authors: BREESE MBH KING PJC GRIME GW SMULDERS PJM SEIBERLING LE BOSHART MA
Citation: Mbh. Breese et al., OBSERVATION OF PLANAR OSCILLATIONS OF MEV PROTONS IN SILICON USING ION CHANNELING PATTERNS, Physical review. B, Condensed matter, 53(13), 1996, pp. 8267-8276

Authors: SAINT A BREESE MBH LEGGE GJF
Citation: A. Saint et al., THE USE OF MIXED BEAMS IN MICROPROBE IMAGING, Review of scientific instruments, 67(8), 1996, pp. 2940-2946

Authors: KING PJC BREESE MBH MEEKESON D SMULDERS PJM WILSHAW PR GRIME GW
Citation: Pjc. King et al., IMAGING OF THE STRAIN FIELD AROUND PRECIPITATE PARTICLES USING TRANSMISSION ION CHANNELING, Journal of applied physics, 80(5), 1996, pp. 2671-2679

Authors: KING PJC BREESE MBH WILSHAW PR SMULDERS PJM GRIME GW
Citation: Pjc. King et al., TRANSMISSION ION CHANNELING IMAGES OF CRYSTAL DEFECTS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 99(1-4), 1995, pp. 419-422
Risultati: 1-25 | 26-49