Citation: Mbh. Breese et Aa. Bailes, DEFECT IMAGING USING CONVERGENT-BEAM ION CHANNELING PATTERNS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 140(1-2), 1998, pp. 178-184
Citation: Dg. Dekerckhove et al., AN OPTIMIZED BEAM ROCKING SYSTEM TO PRODUCE ANGLE-RESOLVED INFORMATION FROM SMALL AREAS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 140(1-2), 1998, pp. 199-208
Citation: Mbh. Breese et al., STRAIN AND DEFECT IMAGING IN THIN-CRYSTALS USING A NUCLEAR MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 23-34
Authors:
DEKERCKHOVE DG
BREESE MBH
MARSH MA
GRIME GW
Citation: Dg. Dekerckhove et al., MASKLESS FABRICATION OF 3-DIMENSIONAL MICROSTRUCTURES IN PMMA USING ANUCLEAR MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 379-384
Authors:
DEKERCKHOVE DG
BREESE MBH
WILKINSON AJ
GRIME GW
Citation: Dg. Dekerckhove et al., DETECTION OF SMALL LATTICE STRAINS USING BEAM ROCKING ON A NUCLEAR MICROPROBE, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1240-1243
Citation: Mbh. Breese et Km. Horn, THE INFLUENCE OF ION-INDUCED DAMAGE ON LATERAL CHARGE COLLECTION AND IBIC IMAGE-CONTRAST, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1349-1354
Citation: Mbh. Breese et al., A COMPARISON BETWEEN THE USE OF EBIC AND IBIC MICROSCOPY FOR SEMICONDUCTOR DEFECT ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 1355-1360
Citation: Mbh. Breese et Dg. Dekerckhove, TRANSMISSION ION MICROSCOPY USING A QUADRUPOLE TRIPLET AS AN OBJECTIVE LENS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 134(3-4), 1998, pp. 431-434
Authors:
BREESE MBH
DEKERCKHOVE DG
KING PJC
SMULDERS PJM
Citation: Mbh. Breese et al., DIRECT OBSERVATION OF LATTICE STRAIN IN SI1-XGEX SI CRYSTALS USING PLANAR CHANNELING PATTERNS/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 132(1), 1997, pp. 177-187
Authors:
ANDEWEG AH
BALLESTRERO S
BEER JUM
BUTLER JE
BREESE MBH
CONNELL SH
DINI L
DOYLE BP
DRUMMOND ML
FORMENTI P
HART RJ
MACHI IZ
MACLEAR RD
MCQUEEN ID
SCHAAFF P
SIDERASHADDAD E
SELLSCHOP JPF
WERNICK G
Citation: Ah. Andeweg et al., THE SCHONLAND MICRO-SCANNING ION-BEAM ANALYSIS FACILITY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 37-44
Authors:
FORMENTI P
BREESE MBH
CONNELL SH
DOYLE BP
DRUMMOND ML
MACHI IZ
MACLEAR RD
SCHAAFF P
SELLSCHOP JPF
BENCH G
SIDERASHADDAD E
ANTOLAK A
MORSE D
Citation: P. Formenti et al., HEAVY-ION AND PROTON-BEAMS IN HIGH-RESOLUTION IMAGING OF A FUNGI SPORE SPECIMEN USING STIM TOMOGRAPHY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 230-236
Citation: Km. Horn et al., VERIFICATION OF 3-DIMENSIONAL CHARGE-TRANSPORT SIMULATIONS USING ION MICROBEAMS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 470-477
Authors:
SCHONE H
BREESE MBH
LEE SR
BRIGGS RD
CASALNUOVO SA
DOYLE BL
DRUMMOND TJ
FRITZ IJ
HAFICH MJ
VAWTER GA
Citation: H. Schone et al., DISLOCATION IMAGING OF AN INALGAAS OPTOELECTRONIC MODULATOR USING IBICC, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 130(1-4), 1997, pp. 551-556
Citation: Mbh. Breese et Pjm. Smulders, A STUDY OF CHANNELING PATTERNS FROM STRAINED SI1-XGEX SI BILAYERS CLOSE TO (011)AXES/, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 129(4), 1997, pp. 511-518
Citation: Dg. Dekerckhove et al., A BEAM ROCKING SYSTEM FOR THE OXFORD NUCLEAR MICROPROBE - A NEW APPROACH TO CHANNELING ANALYSIS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 129(4), 1997, pp. 534-542
Citation: Mbh. Breese, A REVIEW OF ION-BEAM-INDUCED CHARGE MICROSCOPY FOR INTEGRATED-CIRCUITANALYSIS, Materials science & engineering. B, Solid-state materials for advanced technology, 42(1-3), 1996, pp. 67-76
Citation: Pjc. King et al., DEFECT IMAGING AND CHANNELING STUDIES USING CHANNELING SCANNING-TRANSMISSION ION MICROSCOPY, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118(1-4), 1996, pp. 426-430
Citation: Mbh. Breese et al., CHARACTERIZATION OF STRAIN IN CRYSTAL BILAYERS USING ION-CHANNELING PATTERNS, Physical review. B, Condensed matter, 54(14), 1996, pp. 9693-9702
Authors:
BREESE MBH
KING PJC
GRIME GW
SMULDERS PJM
SEIBERLING LE
BOSHART MA
Citation: Mbh. Breese et al., OBSERVATION OF PLANAR OSCILLATIONS OF MEV PROTONS IN SILICON USING ION CHANNELING PATTERNS, Physical review. B, Condensed matter, 53(13), 1996, pp. 8267-8276
Authors:
KING PJC
BREESE MBH
MEEKESON D
SMULDERS PJM
WILSHAW PR
GRIME GW
Citation: Pjc. King et al., IMAGING OF THE STRAIN FIELD AROUND PRECIPITATE PARTICLES USING TRANSMISSION ION CHANNELING, Journal of applied physics, 80(5), 1996, pp. 2671-2679
Citation: Pjc. King et al., TRANSMISSION ION CHANNELING IMAGES OF CRYSTAL DEFECTS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 99(1-4), 1995, pp. 419-422