Authors:
Grima-Gallardo, P
Cardenas, K
Molina, L
Quintero, M
Ruiz, J
Delgado, G
Briceno, JM
Citation: P. Grima-gallardo et al., A comparative study of (Cu-III-Se-2)(x)-(FeSe)(1-x) alloys (III : Al, Ga, In) (0 <= x <= 1) by X-ray diffraction, differential thermal analysis and scanning electron microscopy, PHYS ST S-A, 187(2), 2001, pp. 395-406
Citation: T. Ohgaku et H. Teraji, Investigation of interaction between a dislocation and a Br- ion in NaCl :Br- single crystals, PHYS ST S-A, 187(2), 2001, pp. 407-413
Authors:
Barreau, N
Bernede, JC
Pouzet, J
Guilloux-Viry, M
Perrin, A
Citation: N. Barreau et al., Characteristics of photoconductive MoS2 films grown on NaCl substrates by a sequential process, PHYS ST S-A, 187(2), 2001, pp. 427-437
Authors:
Masri, P
Stauden, T
Pezoldt, J
Averous, M
Citation: P. Masri et al., Elasticity-based approach of interfaces: Application to heteroepitaxy and hetero-systems, PHYS ST S-A, 187(2), 2001, pp. 439-469
Citation: L. Oster et al., The experimental criteria for distinguishing different types of exoelectron emission mechanisms, PHYS ST S-A, 187(2), 2001, pp. 481-485
Citation: V. Cech et J. Stuchlik, Determination of density of localized states in a-Si : H from the time relaxation of space-charge-limited conductivity, PHYS ST S-A, 187(2), 2001, pp. 487-491
Citation: J. Yu et al., Effects of spacer layer thickness and substrate temperature on the magnetoresistance of rf-sputtered CoFe/Cu/NiFe trilayers, PHYS ST S-A, 187(2), 2001, pp. 517-520
Citation: D. Eyidi et al., Chemical composition and crystal lattice defects of Bi2Te3 Peltier device structures, PHYS ST S-A, 187(2), 2001, pp. 585-600
Citation: Mm. El-samanoudy et Ah. Ammar, Some physical and optical properties of the a-Se85SbxS15-x film system, PHYS ST S-A, 187(2), 2001, pp. 611-621