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Authors:
Ni, HQ
Lu, YF
Liu, ZY
Qiu, H
Wang, WJ
Ren, ZM
Chow, SK
Jie, YX
Citation: Hq. Ni et al., Investigation of Li-doped ferroelectric and piezoelectric ZnO films by electric force microscopy and Raman spectroscopy, APPL PHYS L, 79(6), 2001, pp. 812-814
Authors:
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Bowman, RM
Gregg, JM
Foord, DT
Citation: Mh. Corbett et al., Enhancement of dielectric constant and associated coupling of polarizationbehavior in thin film relaxor superlattices, APPL PHYS L, 79(6), 2001, pp. 815-817
Citation: K. Lee et al., Characteristics of ferroelectric Pb(Zr,Ti)O-3 thin films having Pt/PtOx electrode barriers, APPL PHYS L, 79(6), 2001, pp. 821-823
Citation: Wz. Gong et al., Coherent nanoscale islands on La0.5Ca0.5MnO3 thin films and the enhancement of magnetoresistance, APPL PHYS L, 79(6), 2001, pp. 827-829
Authors:
Stevenson, R
Riehn, R
Milner, RG
Richards, D
Moons, E
Kang, DJ
Blamire, M
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Citation: R. Stevenson et al., Ultraviolet-visible near-field microscopy of phase-separated blends of polyfluorene-based conjugated semiconductors, APPL PHYS L, 79(6), 2001, pp. 833-835
Citation: G. Zhou et al., Dimensional effects on field emission properties of the body for single-walled carbon nanotube, APPL PHYS L, 79(6), 2001, pp. 836-838
Citation: W. Zhang et Sy. Chou, Multilevel nanoimprint lithography with submicron alignment over 4 in. Si wafers, APPL PHYS L, 79(6), 2001, pp. 845-847
Authors:
Park, C
Cheng, JY
Fasolka, MJ
Mayes, AM
Ross, CA
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Citation: C. Park et al., Double textured cylindrical block copolymer domains via directional solidification on a topographically patterned substrate, APPL PHYS L, 79(6), 2001, pp. 848-850
Authors:
Volk, T
Ivleva, L
Lykov, P
Isakov, D
Osiko, V
Wohlecke, M
Citation: T. Volk et al., Modification of the optical and photorefractive properties of Ce-doped strontium-barium niobate by co-doping with a nonphotorefractive La impurity, APPL PHYS L, 79(6), 2001, pp. 854-856
Authors:
Higgins, RWT
Monkman, AP
Nothofer, HG
Scherf, U
Citation: Rwt. Higgins et al., Effects of singlet and triplet energy transfer to molecular dopants in polymer light-emitting diodes and their usefulness in chromaticity tuning, APPL PHYS L, 79(6), 2001, pp. 857-859
Citation: K. Cheng et al., On the mechanism of interface trap generation under nonuniform channel-hot-electron stress and uniform carrier-injection stress in metal-oxide-semiconductor field-effect transistors, APPL PHYS L, 79(6), 2001, pp. 863-865
Authors:
Krishnamurthy, S
Reiten, MT
Harmon, SA
Cheville, RA
Citation: S. Krishnamurthy et al., Characterization of thin polymer films using terahertz time-domain interferometry, APPL PHYS L, 79(6), 2001, pp. 875-877