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Results: 1-25/513

Authors: XIA LQ JONES ME MAITY N ENGSTROM JR
Citation: Lq. Xia et al., SUPERSONIC MOLECULAR-BEAM SCATTERING AS A PROBE OF THIN-FILM DEPOSITION PROCESSES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2651-2664

Authors: CHEN YF
Citation: Yf. Chen, EFFECT OF SURFACE EXCITATIONS IN DETERMINING THE INELASTIC MEAN FREE-PATH BY ELASTIC PEAK ELECTRON-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2665-2670

Authors: YANO F HIRAOKA A ITOGA T KOJIMA H KANEHORI K MITSUI Y
Citation: F. Yano et al., X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF SUBMONOLAYER NATIVE OXIDES ON HF-TREATED SI SURFACES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2671-2675

Authors: WILLIAMS JP WILKS SP WILLIAMS RH TARRY HA
Citation: Jp. Williams et al., AN X-RAY PHOTOELECTRON-SPECTROSCOPY STUDY OF THE INTERACTION AND CHEMICAL PASSIVATION OF CHEMICALLY ETCHED (100) ORIENTED HG1-XCDXTE (X=0.226) UTILIZING CHROMIUM AND ALUMINUM, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2676-2683

Authors: BESSOLOV VN EVSTROPOV VV LEBEDEV MV
Citation: Vn. Bessolov et al., INTERFACE EXCITON LUMINESCENCE - AN INDICATION OF INTERFACE INHOMOGENEITIES IN SINGLE GAAS GAALAS HETEROSTRUCTURES/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2684-2688

Authors: HE H NAKAMURA J TAKEHIRO N TANAKA K
Citation: H. He et al., APPLICATION OF HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY TO THE ADSORPTION AND THE PHOTOREACTION OF CH2I2 AND CD3OD ON A MOOX THIN-FILM, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2689-2697

Authors: CHUNG CH MOON SH RHEE SW
Citation: Ch. Chung et al., IN-SITU INFRARED SPECTROSCOPIC STUDY ON THE ROLE OF SURFACE HYDRIDES AND FLUORIDES IN THE SILICON CHEMICAL-VAPOR-DEPOSITION PROCESS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2698-2702

Authors: SOKOLOV NS FALEEV NN GASTEV SV YAKOVLEV NL IZUMI A TSUTSUI K
Citation: Ns. Sokolov et al., CHARACTERIZATION OF MOLECULAR-BEAM EPITAXY-GROWN CDF2 LAYERS BY X-RAY-DIFFRACTION AND CAF2-SM PHOTOLUMINESCENCE PROBE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2703-2708

Authors: KINOSHITA K NISHIYAMA I
Citation: K. Kinoshita et I. Nishiyama, THERMAL-DESORPTION SPECTROSCOPY STUDY OF HF DF-TREATED SI(100) SURFACES/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2709-2714

Authors: TERAKADO S OGURA M SUZUKI S NAKAO M TANAKA K
Citation: S. Terakado et al., MODIFICATION OF SURFACE CONDITION AND IRRADIATION EFFECTS OF SYNCHROTRON-RADIATION ON PHOTOEXCITED ETCHING OF SIC, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2715-2720

Authors: ASCHERL MV CAMPBELL JH LOZANO J CRAIG JH
Citation: Mv. Ascherl et al., STUDY OF ELECTRON-BEAM EFFECTS ON TRIMETHYLSILANE COVERED SI(100), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2721-2725

Authors: PHILLIPS TE BARGERON CB BENSON RC
Citation: Te. Phillips et al., THERMOGRAVIMETRIC ANALYSIS OF SELECTED CONDENSED MATERIALS ON A QUARTZ-CRYSTAL MICROBALANCE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2726-2731

Authors: HSIEH TJ REVAY R BROWER D CHI PH SIMONS DS NEWBURY DE ROBEY SW
Citation: Tj. Hsieh et al., MICROSTRUCTURE AND CHARACTERIZATION OF ELECTRON-TRAPPING STIMULABLE PHOSPHOR SRS(EU,SM) THIN-FILM ON GLASS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2732-2738

Authors: NA JG
Citation: Jg. Na, NEW METHOD TO PREDICT CORROSION CHARACTERISTICS OF ZN-METALLIZED THIN-FILMS FOR FILM CAPACITORS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2739-2741

Authors: KROLL U MEIER J KEPPNER H SHAH A LITTLEWOOD SD KELLY IE GIANNOULES P
Citation: U. Kroll et al., ORIGINS OF ATMOSPHERIC CONTAMINATION IN AMORPHOUS-SILICON PREPARED BYVERY HIGH-FREQUENCY (70 MHZ) GLOW-DISCHARGE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2742-2746

Authors: MOTA RP SHIOSAWA T DURRANT SF DEMORAES MAB
Citation: Rp. Mota et al., AN ACTINOMETRIC STUDY OF C2H2 PLASMA POLYMERIZATION AND FILM PROPERTIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2747-2752

Authors: NEITZERT HC KUNST M
Citation: Hc. Neitzert et M. Kunst, IN-SITU MEASUREMENTS OF THE RECOMBINATION AT THE CRYSTALLINE SILICON AMORPHOUS-SILICON HETEROINTERFACE BY TIME-RESOLVED MICROWAVE CONDUCTIVITY MEASUREMENTS DURING LOW-TEMPERATURE ANNEALING AND SILANE PLASMA EXPOSURE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2753-2757

Authors: MARUO YY SASAKI S TAMAMURA T
Citation: Yy. Maruo et al., CHANGE IN REFRACTIVE-INDEX AND IN CHEMICAL-STATE OF ELECTRON-BEAM IRRADIATED FLUORINATED POLYIMIDE FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2758-2763

Authors: BOSHART MA BAILES AA DYGO A SEIBERLING LE
Citation: Ma. Boshart et al., STRUCTURAL INVESTIGATION OF MONOLAYER SB ON SI(100)-2X1 UTILIZING A MONTE-CARLO SIMULATION OF CHANNELING AND CHANNELED ION ENERGY-LOSS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2764-2771

Authors: HEITZINGER JM EKERDT JG
Citation: Jm. Heitzinger et Jg. Ekerdt, CHEMICAL-REACTIONS OF TRIETHYLANTIMONY ON GAAS(100), Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2772-2780

Authors: NISHIMORI T SAKAMOTO H TAKAKUWA Y KONO S
Citation: T. Nishimori et al., METHANE ADSORPTION AND HYDROGEN ISOTHERMAL DESORPTION-KINETICS ON A C(001)-(1X1) SURFACE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2781-2786

Authors: DELLORTO T ALMEIDA J COLUZZA C CONFORTO E DESTASIO G MARGARITONDO G PAIC G BRAEM A PIUZ F TONNER BP
Citation: T. Dellorto et al., LATERALLY RESOLVED MEASUREMENTS OF CESIUM IODIDE QUANTUM YIELD, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2787-2790

Authors: REDHEAD PA
Citation: Pa. Redhead, MODELING THE PUMP-DOWN OF A REVERSIBLY ADSORBED PHASE .2. MULTILAYER COVERAGE, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2791-2796

Authors: ELAKKAD F NABY MA OMAR MA
Citation: F. Elakkad et al., PHOSPHORUS IMPURITIES IN MGXZN1-XTE ALLOYS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2797-2802

Authors: DIAZ R LEON M
Citation: R. Diaz et M. Leon, EFFECT OF THE COMPOSITION AND ANION VACANCIES IN THE BAND-GAP AND BAND LEVELS OF CU-IN-SE-TE THIN-FILMS, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(6), 1995, pp. 2803-2807
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