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Table of contents of journal: *Review of scientific instruments

Results: 1-25/853

Authors: Barnes, JA Gough, TE Stoer, M
Citation: Ja. Barnes et al., Laser power build-up cavity for high-resolution laser spectroscopy, REV SCI INS, 70(9), 1999, pp. 3515-3518

Authors: Neuhauser, RE Ferstl, B Haisch, C Panne, U Niessner, R
Citation: Re. Neuhauser et al., Design of a low-cost detection system for laser-induced plasma spectroscopy, REV SCI INS, 70(9), 1999, pp. 3519-3522

Authors: Takiya, T Sugiyama, H Zhang, X Shimada, S Yamazato, K Komura, A Ando, M
Citation: T. Takiya et al., New mounting method of diamond monochromator for high brilliance synchrotron radiation, REV SCI INS, 70(9), 1999, pp. 3523-3528

Authors: Calicchia, P Lagomarsino, S Scarinci, F Martinelli, C Formoso, V
Citation: P. Calicchia et al., A study on background subtraction in Auger and photoelectron time coincidence spectroscopy using third generation synchrotron radiation source, REV SCI INS, 70(9), 1999, pp. 3529-3536

Authors: Yun, W Lai, B Krasnoperova, AA Di Fabrizio, E Cai, Z Cerrina, F Chen, Z Gentili, M Gluskin, E
Citation: W. Yun et al., Development of zone plates with a blazed profile for hard x-ray applications, REV SCI INS, 70(9), 1999, pp. 3537-3541

Authors: Bruland, KJ Garbini, JL Dougherty, WM Chao, SH Jensen, SE Sidles, JA
Citation: Kj. Bruland et al., Thermal tuning of a fiber-optic interferometer for maximum sensitivity, REV SCI INS, 70(9), 1999, pp. 3542-3544

Authors: Cremer, JT Piestrup, MA Beguiristain, HR Gary, CK Pantell, RH Tatchyn, R
Citation: Jt. Cremer et al., Cylindrical compound refractive x-ray lenses using plastic substrates, REV SCI INS, 70(9), 1999, pp. 3545-3548

Authors: Wulveryck, JM Mouze, D
Citation: Jm. Wulveryck et D. Mouze, Spectral response measurements of an x-ray sensor camera by a fluorescencewavelength dispersive spectrometer, REV SCI INS, 70(9), 1999, pp. 3549-3553

Authors: Margulies, L Kramer, MJ McCallum, RW Kycia, S Haeffner, DR Lang, JC Goldman, AI
Citation: L. Margulies et al., New high temperature furnace for structure refinement by powder diffraction in controlled atmospheres using synchrotron radiation, REV SCI INS, 70(9), 1999, pp. 3554-3561

Authors: Wicki, A Marsico, V Kuhnke, K Kern, K Paratte, L Schweizer, S Renaud, P
Citation: A. Wicki et al., A micromechanical detector for molecular beams, REV SCI INS, 70(9), 1999, pp. 3562-3565

Authors: Schulte, J Shevchenko, PV Radchik, AV
Citation: J. Schulte et al., Nonlinear field effects in quadrupole mass filters, REV SCI INS, 70(9), 1999, pp. 3566-3571

Authors: Bertacco, R Onofrio, D Ciccacci, F
Citation: R. Bertacco et al., A novel electron spin-polarization detector with very large analyzing power, REV SCI INS, 70(9), 1999, pp. 3572-3576

Authors: Gammino, S Ciavola, G Celona, L Castro, M Chines, F Marletta, S
Citation: S. Gammino et al., 18 GHz upgrading of the superconducting electron cyclotron resonance ion source SERSE, REV SCI INS, 70(9), 1999, pp. 3577-3582

Authors: Wang, SG Brown, IG
Citation: Sg. Wang et Ig. Brown, Unipolar arc simulation device, REV SCI INS, 70(9), 1999, pp. 3583-3585

Authors: Polvani, DA Meng, JF Hasegawa, M Badding, JV
Citation: Da. Polvani et al., Measurement of the thermoelectric power of very small samples at ambient and high pressures, REV SCI INS, 70(9), 1999, pp. 3586-3589

Authors: Rouleau, JF Goyette, J Bose, TK Frechette, MF
Citation: Jf. Rouleau et al., Investigation of a microwave differential cavity resonator device for the measurement of humidity in gases, REV SCI INS, 70(9), 1999, pp. 3590-3594

Authors: Eda, H Oda, I Ito, Y Wada, Y Oikawa, Y Tsunazawa, Y Takada, M Tsuchiya, Y Yamashita, Y Oda, M Sassaroli, A Yamada, Y Tamura, M
Citation: H. Eda et al., Multichannel time-resolved optical tomographic imaging system, REV SCI INS, 70(9), 1999, pp. 3595-3602

Authors: Grauby, S Forget, BC Hole, S Fournier, D
Citation: S. Grauby et al., High resolution photothermal imaging of high frequency phenomena using a visible charge coupled device camera associated with a multichannel lock-in scheme, REV SCI INS, 70(9), 1999, pp. 3603-3608

Authors: Hsu, K Gheber, LA
Citation: K. Hsu et La. Gheber, Tip-sample interaction in a "shear-force" near-field scanning optical microscope, REV SCI INS, 70(9), 1999, pp. 3609-3613

Authors: Stark, M Guckenberger, R
Citation: M. Stark et R. Guckenberger, Fast low-cost phase detection setup for tapping-mode atomic force microscopy, REV SCI INS, 70(9), 1999, pp. 3614-3619

Authors: Quercioli, F Tiribilli, B Ascoli, C Baschieri, P Frediani, C
Citation: F. Quercioli et al., Monitoring of an atomic force microscope cantilever with a compact disk pickup, REV SCI INS, 70(9), 1999, pp. 3620-3624

Authors: Hug, HJ Stiefel, B van Schendel, PJA Moser, A Martin, S Guntherodt, HJ
Citation: Hj. Hug et al., A low temperature ultrahigh vaccum scanning force microscope, REV SCI INS, 70(9), 1999, pp. 3625-3640

Authors: Wilms, M Kruft, M Bermes, G Wandelt, K
Citation: M. Wilms et al., A new and sophisticated electrochemical scanning tunneling microscope design for the investigation of potentiodynamic processes, REV SCI INS, 70(9), 1999, pp. 3641-3650

Authors: Mariotto, G D'Angelo, M Shvets, IV
Citation: G. Mariotto et al., Dynamic behavior of a piezowalker, inertial and frictional configurations, REV SCI INS, 70(9), 1999, pp. 3651-3655

Authors: Grigull, S Foltyn, S Hollander, MG Evans, CR Nastasi, M
Citation: S. Grigull et al., Setup for in situ x-ray diffraction and ion-channeling studies of ion-implantation effects in thin films, REV SCI INS, 70(9), 1999, pp. 3656-3660
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