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Table of contents of journal: *Review of scientific instruments

Results: 1-25/737

Authors: BLACK JF VALENTINI JJ
Citation: Jf. Black et Jj. Valentini, DEVELOPMENT OF A SINGLE-LONGITUDINAL MODE, HIGH-PEAK-POWER, TUNABLE PULSED DYE-LASER, Review of scientific instruments, 65(9), 1994, pp. 2755-2761

Authors: GHISLAIN LP SWITZ NA WEBB WW
Citation: Lp. Ghislain et al., MEASUREMENT OF SMALL FORCES USING AN OPTICAL TRAP, Review of scientific instruments, 65(9), 1994, pp. 2762-2768

Authors: MARAWAR RW COWLES DC KEELER RE WHITE AP FARLEY JW
Citation: Rw. Marawar et al., DIODE-LASER AUTODETACHMENT SPECTROSCOPY, Review of scientific instruments, 65(9), 1994, pp. 2769-2775

Authors: WANG CRC HSU CC LIU WY TSAI WC TZENG WB
Citation: Crc. Wang et al., DETERMINATION OF LASER-BEAM WAIST USING PHOTOIONIZATION TIME-OF-FLIGHT MASS-SPECTROMETER, Review of scientific instruments, 65(9), 1994, pp. 2776-2780

Authors: WANG YC WANG YM PATTERSON LK
Citation: Yc. Wang et al., DUAL-BEAM SPECTROMETER FOR OPTICAL STUDIES OF SPREAD MONOLAYERS AT THE AIR-WATER-INTERFACE, Review of scientific instruments, 65(9), 1994, pp. 2781-2784

Authors: WALLIN SA SCHREINER AF KNOPP JA BARNES NR
Citation: Sa. Wallin et al., READILY CONSTRUCTED MODULAR POLARIZATION-EMISSION SCANNING SPECTROMETER, Review of scientific instruments, 65(9), 1994, pp. 2785-2791

Authors: KNAPP GS BENO MA ROGERS CS WILEY CL COWAN PL
Citation: Gs. Knapp et al., SOLUTION TO THE HIGH HEAT LOADS FROM UNDULATORS AT 3RD GENERATION SYNCHROTRON SOURCES - CRYOGENIC THIN-CRYSTAL MONOCHROMATORS, Review of scientific instruments, 65(9), 1994, pp. 2792-2797

Authors: GOLNABI H
Citation: H. Golnabi, DESIGN AND CONSTRUCTION OF A HIGH-PRECISION COMPUTER-CONTROLLED MONOCHROMATOR, Review of scientific instruments, 65(9), 1994, pp. 2798-2801

Authors: RUBEY WA
Citation: Wa. Rubey, AN INSTRUMENTATION ASSEMBLY FOR STUDYING OPERATIONAL BEHAVIOR OF THERMAL-GRADIENT PROGRAMMED GAS-CHROMATOGRAPHY, Review of scientific instruments, 65(9), 1994, pp. 2802-2807

Authors: KOCH M
Citation: M. Koch, ON THE CONVERSION OF A MASS-SELECTIVE DETECTOR FROM GAS-CHROMATOGRAPHY MASS-SPECTROMETRY APPLICATION TO STAND-ALONE, ONLINE, REAL-TIME MASS-SPECTROMETRY APPLICATION, Review of scientific instruments, 65(9), 1994, pp. 2808-2818

Authors: DEVOS P DEBATIST R CORNELIS J
Citation: P. Devos et al., LOW-COST OPEN-LOOP VIBRATING REED MECHANICAL SPECTROMETER USING PULSE-TRAIN EXCITATION AND CAPACITIVE CURRENT DETECTION, Review of scientific instruments, 65(9), 1994, pp. 2819-2822

Authors: GUPTA VK KORNFIELD JA
Citation: Vk. Gupta et Ja. Kornfield, POLARIZATION MODULATION LASER-SCANNING MICROSCOPY - A POWERFUL TOOL TO IMAGE MOLECULAR-ORIENTATION AND ORDER, Review of scientific instruments, 65(9), 1994, pp. 2823-2828

Authors: BERGER CEH KOOYMAN RPH GREVE J
Citation: Ceh. Berger et al., RESOLUTION IN SURFACE-PLASMON MICROSCOPY, Review of scientific instruments, 65(9), 1994, pp. 2829-2836

Authors: COATH CD PLUMMER IR TURNER DW
Citation: Cd. Coath et al., RELATIVE SECONDARY-ELECTRON YIELDS FROM CLEAN METALS UNDER FAST-ATOM-BOMBARDMENT AND ANGLE-INTEGRATED UV-PHOTOELECTRON SPECTRA IN A PHOTOELECTRON SPECTROMICROSCOPE, Review of scientific instruments, 65(9), 1994, pp. 2837-2843

Authors: FUKUOKA M SAKAI Y TSUNODA K ICHINOKAWA T
Citation: M. Fukuoka et al., A MICROSCANNING ELECTRON-MICROSCOPE IN ULTRAHIGH-VACUUM FOR SURFACE MICROANALYSIS, Review of scientific instruments, 65(9), 1994, pp. 2844-2848

Authors: WILDOER JWG VANROY AJA VANKEMPEN H HARMANS CJPM
Citation: Jwg. Wildoer et al., LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPE FOR USE AN ARTIFICIALLYFABRICATED NANOSTRUCTURES, Review of scientific instruments, 65(9), 1994, pp. 2849-2852

Authors: ERMAKOV AV GARFUNKEL EL
Citation: Av. Ermakov et El. Garfunkel, A NOVEL AFM STM SEM SYSTEM, Review of scientific instruments, 65(9), 1994, pp. 2853-2854

Authors: TESSMER SH VANHARLINGEN DJ LYDING JW
Citation: Sh. Tessmer et al., INTEGRATED CRYOGENIC SCANNING-TUNNELING-MICROSCOPY AND SAMPLE PREPARATION SYSTEM, Review of scientific instruments, 65(9), 1994, pp. 2855-2859

Authors: CARRARA S FACCI P NICOLINI C
Citation: S. Carrara et al., MORE INFORMATION ON THE CALIBRATION OF SCANNING STYLUS MICROSCOPES BY2-DIMENSIONAL FAST FOURIER-TRANSFORM ANALYSIS, Review of scientific instruments, 65(9), 1994, pp. 2860-2863

Authors: STOLL EP
Citation: Ep. Stoll, CORRECTION OF GEOMETRICAL DISTORTIONS IN SCANNING TUNNELING AND ATOMIC-FORCE MICROSCOPES CAUSED BY PIEZO HYSTERESIS AND NONLINEAR FEEDBACK, Review of scientific instruments, 65(9), 1994, pp. 2864-2869

Authors: GODDENHENRICH T MULLER S HEIDEN C
Citation: T. Goddenhenrich et al., A LATERAL MODULATION TECHNIQUE FOR SIMULTANEOUS FRICTION AND TOPOGRAPHY MEASUREMENTS WITH THE ATOMIC-FORCE MICROSCOPE, Review of scientific instruments, 65(9), 1994, pp. 2870-2873

Authors: RAMSEY DA LUDEMA KC
Citation: Da. Ramsey et Kc. Ludema, THE INFLUENCES OF ROUGHNESS ON FILM THICKNESS MEASUREMENTS BY MUELLERMATRIX ELLIPSOMETRY, Review of scientific instruments, 65(9), 1994, pp. 2874-2881

Authors: FRIEDL A FUKAREK W MOLLER W KOCH A
Citation: A. Friedl et al., IN-SITU CHARACTERIZATION OF PLASMA-DEPOSITED A-C-H THIN-FILMS BY SPECTROSCOPIC INFRARED ELLIPSOMETRY, Review of scientific instruments, 65(9), 1994, pp. 2882-2889

Authors: BAIER T WALTER T MAUCKNER G SCHNEIDER J THONKE K SAUER R
Citation: T. Baier et al., MEASUREMENT OF TIME-RESOLVED PHOTOLUMINESCENCE OF SEMICONDUCTORS USING CORRELATIONAL ANALYSIS, Review of scientific instruments, 65(9), 1994, pp. 2890-2893

Authors: MATSUMOTO H
Citation: H. Matsumoto, MATERIAL CHARACTERIZATION USING A FREQUENCY-DOUBLING 2-COLOR INTERFEROMETER, Review of scientific instruments, 65(9), 1994, pp. 2894-2895
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